Method and apparatus for neutron microscopy with stoichiometric imaging
First Claim
1. A system for non-invasive stoichiometric detection and imaging of chemical elements and compounds in a material to be analyzed, the system comprising:
- a particle generator, the particle generator generating a plurality of first subatomic particles and a plurality of second subatomic particles at a target position which is a first distance from the material to be analyzed;
at least one photon detector, the at least one photon detector being capable of detecting photons resulting from irradiation of the material to be analyzed by the first subatomic particles and generating a plurality of first electrical signals;
a particle detector array comprising a plurality of particle detectors, the detector array at a second distance from the target position, the second distance being larger than the first distance, the particle detectors each being capable detecting at least one second subatomic particle from the particle generator, and generating a plurality of second electrical signals; and
an analyzer operatively connected to the particle detector array and the at least one photon detector, comprising;
a processor, the processor filtering the plurality of first electrical signals so as to produce a plurality of filtered electrical signals; and
a plurality of electronic coincidence circuits, the coincidence circuits detecting coincidences occurring between the plurality of filtered electrical signals and the plurality of second electrical signals.
3 Assignments
0 Petitions
Accused Products
Abstract
A system provides non-invasive stoichiometric detection and imaging of chemical elements and compounds in a material to be analyzed. The system includes a particle generator which generates first and second particles at a target position a first distance from the material. The system further comprises a photon detector capable of detecting photons resulting from irradiation of the material by the first particles and generating a plurality of first electrical signals. The system further comprises a particle detector array for detecting the second partices at a second distance, larger than the first distance, from the target position and generating a plurality of second electrical signals. The system further comprises an analyzer comprising a processor that produces a plurality of filtered electrical signals. The analyzer further comprises a plurality of electronic coincidence circuits which detect coincidences occurring between the plurality of filtered electrical signals and the plurality of second electrical signals.
48 Citations
25 Claims
-
1. A system for non-invasive stoichiometric detection and imaging of chemical elements and compounds in a material to be analyzed, the system comprising:
-
a particle generator, the particle generator generating a plurality of first subatomic particles and a plurality of second subatomic particles at a target position which is a first distance from the material to be analyzed;
at least one photon detector, the at least one photon detector being capable of detecting photons resulting from irradiation of the material to be analyzed by the first subatomic particles and generating a plurality of first electrical signals;
a particle detector array comprising a plurality of particle detectors, the detector array at a second distance from the target position, the second distance being larger than the first distance, the particle detectors each being capable detecting at least one second subatomic particle from the particle generator, and generating a plurality of second electrical signals; and
an analyzer operatively connected to the particle detector array and the at least one photon detector, comprising;
a processor, the processor filtering the plurality of first electrical signals so as to produce a plurality of filtered electrical signals; and
a plurality of electronic coincidence circuits, the coincidence circuits detecting coincidences occurring between the plurality of filtered electrical signals and the plurality of second electrical signals. - View Dependent Claims (2, 3, 4)
-
-
5. A system for detecting and imaging a chemical substance, comprising:
-
a particle source, the source generating a plurality of first subatomic particles and a plurality of second subatomic particles from a target position a first distance from the chemical substance, the first subatomic particles irradiating the chemical substance;
at least one photon detector capable of detecting photons resulting from the irradiation of the chemical substance by the first subatomic particles;
a particle detector array comprising a plurality of particle detectors, the particle detector array capable of detecting at least one second subatomic particle, the particle detector array at a second distance from the target position, the second distance larger than the first distance; and
an analyzer capable of detecting and imaging the chemical substance based on signals output from the at least one photon detector and the at least one particle detector. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
-
-
18. A method of detecting and imaging the presence of a chemical compound located within an object, the method comprising:
-
generating a plurality of pairs of particles from a target position spaced a first distance from the object, each pair of particles comprising a first particle and a second particle;
impinging the object with the plurality of first particles, the first particles interacting with nuclei of the chemical compound and the object to generate nuclear emissions from the chemical compound and the object;
detecting the plurality of second particles using a particle detector array comprising a plurality of particle detectors, the particle detector array spaced a second distance from the target position, the second distance larger than the first distance;
detecting the nuclear emissions from the chemical compound and the object;
processing the detected nuclear emissions to substantially eliminate a fraction of the nuclear emissions; and
detecting the chemical compound by analyzing the detected nuclear emissions which are not eliminated by the processing. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25)
-
Specification