Scheduling the concurrent testing of multiple cores embedded in an integrated circuit
First Claim
1. A method for optimizing concurrent testing of cores within an integrated circuit comprising:
- representing testing of multiple cores, wherein a test of an individual core is represented as a function of at least integrated circuit pins used to test the core and core test time;
representing a test schedule of the integrated circuit as a bin having dimensions of at least integrated circuit pins and integrated circuit test time; and
scheduling the testing of the cores within the integrated circuit by fitting the multiple core test representations into the bin.
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Abstract
Methods are described for scheduling the concurrent testing of multiple cores embedded in an integrated circuit. Test scheduling is performed by formulating the problem as a bin-packing problem and using a modified two-dimensional or three-dimensional bin-packing heuristic. The tests of multiple cores are represented as functions of at least the integrated circuit pins used to test the core and the core test time. The representations may include a third dimension of peak power required to test the core. The test schedule is represented as a bin having dimensions of at least integrated circuit pins and integrated circuit test time. The bin may include a third dimension of peak power. The scheduling of the multiple cores is accomplished by fitting the multiple core test representations into the bin.
29 Citations
36 Claims
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1. A method for optimizing concurrent testing of cores within an integrated circuit comprising:
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representing testing of multiple cores, wherein a test of an individual core is represented as a function of at least integrated circuit pins used to test the core and core test time;
representing a test schedule of the integrated circuit as a bin having dimensions of at least integrated circuit pins and integrated circuit test time; and
scheduling the testing of the cores within the integrated circuit by fitting the multiple core test representations into the bin. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
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30. A method for testing multiple cores embedded in an integrated circuit comprising:
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representing the testing of multiple cores, wherein each core is represented as at least a two-dimensional function; and
using a bin-packing heuristic to optimize scheduling of the representations. - View Dependent Claims (31, 32)
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33. A method for testing multiple cores embedded in an integrated circuit comprising scheduling concurrent testing of multiple cores within the integrated circuit such that the testing occurs using a fixed number of integrated circuit pins, the scheduling comprising:
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dividing the testing into multiple test sessions; and
assigning a testing of a core to a test session having fewer unassigned integrated circuit pins than other testing sessions. - View Dependent Claims (34, 35)
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36. A method for testing multiple cores embedded in an integrated circuit comprising scheduling concurrent testing of multiple cores within the integrated circuit such that the testing occurs within a fixed period of time and an overall number of integrated circuit pins used to test the cores is minimized.
Specification