Power-on state machine implementation with a counter to control the scan for products with hard-BISR memories
First Claim
Patent Images
1. An apparatus comprising:
- a controller circuit configured to present one or more control signals, wherein said control signals are configured to control one or more built-in self-test (BIST) and built-in self-repair (BISR) modes of operation; and
a BISR assembly circuit comprising one or more memory blocks each comprising a counter configured to generate a clock cycle count value in response to a repair solution, wherein said memory blocks are remapped in response to said count values during one or more of said BISR operations.
7 Assignments
0 Petitions
Accused Products
Abstract
An apparatus comprising a controller circuit and a BISR assembly circuit. The controller circuit may be configured to present one or more control signals. The control signals may be configured to control one or more built-in self-test (BIST) and built-in self-repair (BISR) modes of operation. The BISR assembly circuit generally comprises one or more memory blocks each comprising a counter configured to generate a clock cycle count value in response to a repair solution during the BIST and BISR operations. The memory blocks may be remapped in response to the count values during one or more of the BISR operations.
-
Citations
20 Claims
-
1. An apparatus comprising:
-
a controller circuit configured to present one or more control signals, wherein said control signals are configured to control one or more built-in self-test (BIST) and built-in self-repair (BISR) modes of operation; and
a BISR assembly circuit comprising one or more memory blocks each comprising a counter configured to generate a clock cycle count value in response to a repair solution, wherein said memory blocks are remapped in response to said count values during one or more of said BISR operations. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
-
13. An apparatus for remapping a memory circuit comprising:
-
means for presenting one or more control signals, wherein said control signals are configured to control one or more built-in self-test (BIST) and built-in self-repair (BISR) modes of operation of said memory circuit;
means for generating one or more clock cycle count values in response to a repair solution; and
means for controlling said one or more BISR operations in response to said count values.
-
-
14. A method for remapping a memory circuit comprising the steps of:
-
(A) presenting one or more control signals, wherein said control signals are configured to control one or more built-in self-test (BIST) and built-in self-repair (BISR) modes of operation of said memory circuit;
(B) generating one or more clock cycle count values in response to a repair solution; and
(C) controlling said one or more BISR operations in response to said count values. - View Dependent Claims (15, 16, 17, 18, 19, 20)
-
Specification