Alignment and orientation features for a semiconductor package
First Claim
1. A method of electrically connecting a first plurality of bonding pads of a semiconductor die to a second plurality of bonding pads located on lead fingers of a lead frame of a semiconductor device, the method comprising:
- obtaining an image of the lead frame;
identifying the location of at least one eyepoint feature formed on a die paddle of the lead frame adapted to receive the semiconductor die;
determining the relative locations of the second plurality of bonding pads from the identified location of the eyepoint feature located on the die paddle of the lead frame;
directing a wire bonding device to form wire bonds between the first and second pluralities of bonding pads using the determined relative locations of the second plurality of bonding pads.
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Accused Products
Abstract
A semiconductor device formed by an automated wire bonding system. The semiconductor device comprises a lead frame having a plurality of lead fingers and a die paddle, and a semiconductor die mounted to the die paddle. The die paddle comprises a plurality of eyepoint features that extend from the die. The die comprises a first plurality of bonding pads and the lead fingers comprise a second plurality of bonding pads. The first and second bonding pads are interconnected by a plurality of connecting wires which are installed by the automated wire bonding system. The wire bonding system obtains an image of the lead frame and identifies the eyepoint features of the die paddle within the image so as to more accurately determine the positions of the second wire bonding pads of the lead frame with respect to the wire bonding system
18 Citations
8 Claims
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1. A method of electrically connecting a first plurality of bonding pads of a semiconductor die to a second plurality of bonding pads located on lead fingers of a lead frame of a semiconductor device, the method comprising:
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obtaining an image of the lead frame;
identifying the location of at least one eyepoint feature formed on a die paddle of the lead frame adapted to receive the semiconductor die;
determining the relative locations of the second plurality of bonding pads from the identified location of the eyepoint feature located on the die paddle of the lead frame;
directing a wire bonding device to form wire bonds between the first and second pluralities of bonding pads using the determined relative locations of the second plurality of bonding pads. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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Specification