Method for on-line testing of a light emitting panel

• US 20030207643A1
• Filed: 08/09/2002
• Published: 11/06/2003
• Est. Priority Date: 10/27/2000
• Status: Active Grant

• Current Assignee: Leidos, Inc. (Leidos Holdings, Inc.)
• Original Assignee: Science Applications International Corporation
• Inventors: Green, Albert M., Wyeth, N. Convers, George, E. Victor
• Granted Patent: US 6,935,913 B2
• Time in Patent Office: Days
• US Class Current: 445/3
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/22 using controlled light sources
• CPC Class Codes: H01J 11/18 containing a plurality of independent closed structures for containing the gas, e.g. plasma tube array [PTA] display panels
• CPC Class Codes: H01J 17/49 Display panels, e.g. with crossed electrodes , e.g. making use of direct current display panels making use of alternating current H01J11/00
• CPC Class Codes: H01J 2217/492 Details
• CPC Class Codes: H01J 9/42 Measurement or testing during manufacture

Abstract

A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.

Claims

1. A method for on-line testing micro-components within an assembled web during continuous manufacturing of the assembled web, the method comprising:

passing at least a portion of the assembled web within a field of view of at least one radiometric output measuring device;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

processing of the assembled web in accordance with the analysis.

2. The method of claim 1, wherein the step of exciting at least one selected micro-component further comprises directing an electron beam to a selected area of the assembled web.

3. The method of claim 1, wherein a plurality of selected micro-components are excited.

4. The method of claim 1, wherein the step of analyzing the detected radiation includes identifying an absence of luminescence from the selected micro-component.

5. The method of claim 4, wherein the step of disposing of the assembled web comprises removing sections of the assembled web containing the micro-component having no luminescence.

6. The method of claim 4, wherein the step of disposing of the assembled web comprises removing the micro-component having no luminescence from the assembled web and adding a replacement micro-component to the web at a location vacated by the removed micro-component.

7. The method of claim 1, wherein the step of analyzing the detected radiation comprises:

determining the existing or absence of radiation;

determining the color of the radiation; and

,

determining the intensity of the radiation.

8. The method of claim 7, wherein:

the step of analyzing the detected radiation further comprises determining locations on the assembled web where a first colored micro-component is transposed within a second colored micro-component; and

,

the step of disposing of the assembled web comprising switching the first and second micro-components.

9. The method of claim 1, wherein the radiometric measuring device is a high resolution electronic camera.

10. The method of claim 1, wherein the radiometric measuring device has a resolution sufficient to resolve a single micro-component in the assembled web.

11. The method of claim 1, wherein the radiometric measuring device can scan the assembled web using either line imaging or area imaging.

12. A method for on-line testing of a plurality of micro-components within an assembled web during a continuous manufacturing process of the assembled web, the method comprising:

passing at least a portion of the assembled web within a field of view of a plurality of radiometric output measuring devices disposed at various locations throughout the continuous manufacturing process;

exciting at least one selected micro-component disposed on the assembled web within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

disposing of the assembled web in accordance with the analysis.

13. The method of claim 12, wherein a plurality of micro-components are excited.

14. The method of claim 12, wherein the entire assembled web is passed within the field of view and all of the micro-components within the field of view are excited.

15. The method of claim 14, further comprising accumulating a length of the assembled web within the field of view.

16. The method of claim 12, wherein the plurality of radiometric output measuring devices are each connected to a central processor and the step of analyzing the detected radiation is conducted by the central processor.

17. A method of on-line testing a light-emitting panel during continuous manufacturing of the panel, the method comprising:

passing at least a portion of the light-emitting panel within a field of view of at least one radiometric measuring device;

exciting at least one selected micro-component disposed on the light-emitting panel within the field of view to luminescence;

detecting radiation emitted from the selected micro-component;

analyzing the detected radiation; and

,

disposing of the light-emitting panel in accordance with the analysis.

18. The method of claim 17, wherein the step of analyzing the detected radiation comprises:

determining the existence or absence of radiation;

determining the color of the radiation;

determining the intensity of the radiation; and

,

logging occurrences of absence of radiation, improper color or inadequate intensity; and

the step of disposing of the light-emitting panel comprises;

using display programming to compensate for the absence of radiation, improper color, or inadequate intensity.

19. The method of claim 17 wherein:

the light-emitting panel comprises an arrangement of electrodes and control circuitry to address individual micro-components within the panel; and

,

the step of exciting further comprises using the electrodes and control circuitry to excite at least one micro-component.