System for evaluating probing networks
First Claim
1. An interconnect assembly for use in evaluating a probing-device, said probing-device having a plurality of device probing ends, the device probing ends each having a width and being separated from each other by a predetermined spacing, said interconnect assembly comprising:
- (a) a base having an upper face, said face having a circular conductive pad, and said pad having a diameter substantially equal to the width of each of said probing ends;
(b) said face further including an annular dielectric area surrounding said conductive pad and coplanar therewith;
(c) said face further including an outer conductive area surrounding said annular dielectric area and substantially coplanar therewith; and
(d) said annular dielectric area having a radial width, between said conductive pad and said outer conductive area, substantially equal to said spacing between said device probing ends.
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Accused Products
Abstract
An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the reference junction so that high-frequency signals can be uniformly transferred therebetween despite, for example, variable positioning of the device-probing ends of the network on the probing areas. A preferred method for evaluating the signal channels of the network includes connecting a reference unit to the reference junction and successively positioning each device-probing end that corresponds to a signal channel of interest on the inner probing area. Because the transmission structure uniformly transfers signals, the relative condition of the signals as they enter or leave each end will substantially match the condition of the signals as measured or presented by the reference unit, thereby enabling calibration of the network in reference to the device-probing ends. The assembly is particularly well-adapted for the evaluation of probe measurement networks of the type used for testing planar microelectronic devices.
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Citations
9 Claims
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1. An interconnect assembly for use in evaluating a probing-device, said probing-device having a plurality of device probing ends, the device probing ends each having a width and being separated from each other by a predetermined spacing, said interconnect assembly comprising:
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(a) a base having an upper face, said face having a circular conductive pad, and said pad having a diameter substantially equal to the width of each of said probing ends;
(b) said face further including an annular dielectric area surrounding said conductive pad and coplanar therewith;
(c) said face further including an outer conductive area surrounding said annular dielectric area and substantially coplanar therewith; and
(d) said annular dielectric area having a radial width, between said conductive pad and said outer conductive area, substantially equal to said spacing between said device probing ends. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification