Process for formation of a wiring network using a porous interlevel dielectric and related structures
First Claim
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1. A method for forming a wiring network of an integrated circuit, comprising:
- providing an integrated circuit substrate comprising a first conductive element;
applying a precursor to the substrate, the precursor comprising a host thermosetting material and a porogen;
producing crosslinking of at least some of the host thermosetting material to form a low-k dielectric matrix without decomposing all of the porogen;
inlaying a second conductive element in the low-k dielectric matrix in contact with the first conductive element; and
decomposing remaining porogen to leave pores in the low-k dielectric matrix.
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Abstract
A precursor of a low-k porous dielectric is applied to an integrated circuit substrate. The precursor comprises a host thermosetting material and a porogen. Crosslinking of at least some of the first host thermosetting material is produced to form a low-k dielectric matrix without decomposing all of the porogen. This leaves a solid nonporous layer of the low-k dielectric matrix. Wiring elements are then inlaid in the low-k dielectric matrix. After the wiring elements are formed, remaining porogen is decomposed to leave pores in the low-k dielectric matrix. The resulting wiring elements are smooth walled.
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Citations
26 Claims
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1. A method for forming a wiring network of an integrated circuit, comprising:
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providing an integrated circuit substrate comprising a first conductive element;
applying a precursor to the substrate, the precursor comprising a host thermosetting material and a porogen;
producing crosslinking of at least some of the host thermosetting material to form a low-k dielectric matrix without decomposing all of the porogen;
inlaying a second conductive element in the low-k dielectric matrix in contact with the first conductive element; and
decomposing remaining porogen to leave pores in the low-k dielectric matrix. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A wiring network of an integrated circuit, comprising:
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an integrated circuit substrate comprising a first conductive element;
a second conductive element contacting the first conductive element, the second conductive element having smooth walls;
a layer of porous interlevel dielectric formed over the substrate and surrounding the second conductive element; and
a stop layer formed over the porous interlevel dielectric, the stop layer being permeable to a decomposition product of a porogen of a precursor of the porous interlevel dielectric. - View Dependent Claims (13)
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14. A method for forming a wiring network of an integrated circuit, comprising:
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providing an integrated circuit substrate comprising a first conductive element;
applying a first precursor to the substrate, the first precursor comprising a first host thermosetting material and a first porogen;
producing crosslinking of at least some of the first host thermosetting material to form a first low-k dielectric matrix without decomposing all of the first porogen;
forming a first stop layer over the first low-k dielectric matrix;
applying a second precursor to the first stop layer, the second precursor comprising a second host thermosetting material and a second porogen;
producing crosslinking of at least some of the second host thermosetting material to form a second low-k dielectric matrix without decomposing all of the second porogen;
forming a second stop layer over the second low-k dielectric matrix;
forming a trench defining a dual damascene structure in the first and second low-k dielectric matrixes and the first and second stop layers to expose the first conductive element;
inlaying a second conductive element in the trench in contact with the first conductive element; and
decomposing remaining first and second porogen to leave pores in the first and second low-k dielectric matrixes. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A wiring network of an integrated circuit, comprising:
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an integrated circuit substrate comprising a first conductive element;
a dual damascene conductive element contacting the first conductive element, the dual damascene conductive element having smooth walls; and
first and second layers of porous interlevel dielectric formed over the substrate and surrounding the smooth walls of the dual damascene conductive element, the first and second layers of porous interlevel dielectric being separated by a stop layer. - View Dependent Claims (26)
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Specification