×

Apparatus and method for inspecting pattern

  • US 20030228049A1
  • Filed: 05/22/2003
  • Published: 12/11/2003
  • Est. Priority Date: 06/11/2002
  • Status: Abandoned Application
First Claim
Patent Images

1. An apparatus for inspecting pattern on an object, comprising:

  • an image pickup device for performing an image pickup of an object to acquire data of multitone inspection image;

    a memory for storing data of reference image and classification data obtained by adding a class to each pixel of said inspection image;

    a feature value calculation part for calculating a feature value on the basis of a value of each of a plurality of pixels selected from said inspection image and a value of corresponding pixel in said reference image;

    a dataset generation part for generating a dataset indicating a combination of a feature value and a class on each of said plurality of pixels; and

    a classifier construction part for constructing a classifier by training with said dataset to output a classification result in accordance with an inputted feature value.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×