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Method and apparatus for generating deterministic, non-repeating, pseudo-random addresses

  • US 20040006680A1
  • Filed: 06/28/2002
  • Published: 01/08/2004
  • Est. Priority Date: 06/28/2002
  • Status: Active Grant
First Claim
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1. A method for testing a memory circuit, the method comprising:

  • multiplying a first number in a sequence of deterministic pseudo-random numbers by a multiplier;

    discarding all of the product of said act of multiplying except for a first plurality of low order bits representing a portion of said product, said first plurality of low order bits also representing a first memory address; and

    testing a portion of said memory circuit represented by said first memory address.

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