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Method for testing a device and a test configuration including a device with a test memory

  • US 20040015313A1
  • Filed: 07/18/2001
  • Published: 01/22/2004
  • Est. Priority Date: 07/18/2000
  • Status: Active Grant
First Claim
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1. A method for testing a device, which comprises:

  • using a test method to test a device and to determine test results; and

    storing the test results in a memory in the device.

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  • 4 Assignments
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