Descriptor for identifying a defective die site and methods of formation
First Claim
1. A substrate for mounting at least one semiconductor die thereon, comprising:
- a substrate having at least one semiconductor die site; and
a designator on a surface of the substrate including encoded information relating to at least one defect in the at least one semiconductor die site.
7 Assignments
0 Petitions
Accused Products
Abstract
The present invention relates to the marking and identification of defective die sites on a mounting substrate. A mounting substrate is provided which is inspected and tested for visual and electrical defects. Information relating to the functionality and/or various defects of one or more die sites is then encoded in the form of a designator placed on the substrate. The information encoded on the designator may then be read or scanned by, for example, computer-driven video equipment and used in a die-attach process to discriminately place semiconductor dice only on known good die sites. Embodiments of the designator include information encoded in the form of a bar code, a series of identifying marks, a strip of magnetic tape or a computerized map of a mounting substrate. Correlated data regarding die site functionality can then be electronically transferred to a die-bonding apparatus.
36 Citations
9 Claims
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1. A substrate for mounting at least one semiconductor die thereon, comprising:
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a substrate having at least one semiconductor die site; and
a designator on a surface of the substrate including encoded information relating to at least one defect in the at least one semiconductor die site. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification