De-embedment of optical component characteristics and calibration of optical receivers using rayleigh backscatter

• US 20040036886A1
• Filed: 08/21/2002
• Published: 02/26/2004
• Est. Priority Date: 08/21/2002
• Status: Active Grant

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Baney, Douglas M., Motamedi, Ali R.
• Granted Patent: US 6,947,147 B2
• Time in Patent Office: Days
• US Class Current: 356/477
• CPC Class Codes: G01J 1/08 Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
• CPC Class Codes: G01M 11/3109 Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
• CPC Class Codes: G01N 2021/4709 Backscatter

Abstract

Method and system are disclosed for de-embedding optical component characteristics from optical device measurements In particular, the invention uses frequency domain averaging of the RBS on both sides of an optical component to determine one or more of its optical characteristics. Where the RBS has a slope (e.g., as in the case of a lossy fiber), a frequency domain least square fit can be used to determine the optical component characteristics. In addition, the invention uses a reference DUT to correct for variations in the frequency response of the photoreceiver A reference interferometer is used in the invention to correct for sweep non-linearity of the TLS. The optical component characteristics are then de-embedded from optical device measurements to provide a more precise analysis of the optical device.

Claims

1. A method of de-embedding optical component characteristics from optical device measurements using Rayleigh backscatter (RBS), comprising:

sweeping an optical signal at a predefined sweep rate over a predefined wavelength range;

detecting the RBS on both sides of an optical component;

obtaining a frequency domain average or a frequency domain least square fit for the RBS on both sides of the optical component;

determining an optical component characteristic from the frequency domain average or the frequency domain least square fit; and

de-embedding the optical component characteristic from the optical device measurements.

2. The method according to claim 1, wherein the RBS is detected using an optical interferometric analyzer.

3. The method according to claim 2, wherein the optical component characteristic includes a predetermined one of transmission loss, optical reflectivity, and dispersion

4. The method according to claim 2, further comprising defining a data window around the RBS on both sides of the optical component, and adjusting a size of the data windows to increase the number of data points available for averaging.

5. The method according to claim 2, further comprising adjusting the wavelength range of the optical signal to increase a spatial resolution of the analyzer

6. The method according to claim 2, further comprising correcting for photoreceiver frequency response variation using a reference device under test

7. The method according to claim 2, further comprising correcting for sweep non-linearity in the RBS using a reference interferometer

8. The method according to claim 1, further comprising varying a polarization state of the optical signal and determining an optical component characteristic for each polarization state.

9. The method according to claim 8, further comprising subtracting a minimum value of the optical component characteristic from a maximum value of the optical component characteristic to determine a polarization dependence of the optical component characteristic.

10. The method according to claim 9, wherein the minimum value and the maximum value of the optical component characteristic are determined using a preselected one of a Jones matrix and a Mueller matrix method.

11. The method according to claim 8, wherein the step of varying a polarization state is performed using a polarizer, further comprising determining an output power profile of the polarizer for each polarization state, and adjusting the optical component characteristic using the output power profile.

12. The method according to claim 1, further comprising storing information for different optical fibers in a lookup table, and using the information to adjust the optical component characteristic.

13. An optical device analyzer for use with an interferometer and a photoreceiver, the interferometer receiving an optical signal at a predefined sweep rate over a predefined wavelength range from an optical source, and the photoreceiver detecting RBS in a composite signal from the interferometer, comprising;

a signal processing unit configured capture RBS on both sides of an optical component from the photoreceiver and to transform the RBS from the time domain to the frequency domain; and

15. The optical device analyzer according to claim 13, wherein the data processing module is further configured to determine an optical component characteristic based on the averaged RBS or the least square fit.

19. The optical device analyzer according to claim 13, wherein the data processing module is further configured to adjust the wavelength range of the optical signal to increase a spatial resolution of the optical device analyzer.

20. The optical device analyzer according to claim 13, further comprising an optical polarizing beam splitter configured to split the composite signal into orthogonal polarization components.

21. The optical device analyzer according to claim 19, wherein the signal processing unit is further configured to square the polarization components and to add the squares to obtain a polarization-diverse signal.

22. The optical device analyzer according to claim 13, wherein the signal processing unit is further configured to correct for photoreceiver frequency response variation using a reference device under test.

23. The optical device analyzer according to claim 21, wherein the reference device under test is an optical fiber having a length such that the highest beat frequency resulting therefrom is at the upper cut-off frequency of the photoreceiver.

24. The optical device analyzer according to claim 13, wherein the signal processing unit is further configured to correct for sweep non-linearity in the optical source using a reference interferometer.

25. The optical device analyzer according to claim 13, wherein the signal processing unit is further configured to correct for sweep non-linearity in the optical source using a wave meter.

26. The optical device analyzer according to claim 13, wherein the optical device analyzer is an optical interferometric analyzer.

28. The optical device analyzer according to claim 26, wherein data processing module is configured to subtract a minimum value of the optical component characteristic from a maximum value of the optical component characteristic to determine a polarization dependence of the optical component characteristic.

30. The optical device analyzer according to claim 26, wherein the data processing module is configured determine an output power profile of the polarizer for each polarization state, and to adjust the optical component characteristic using the output power profile.

14. a data processing module configured to determine a frequency domain average for the RBS or a frequency domain least square fit for the RBS

16. The optical device analyzer according to claim 14, wherein the optical component characteristic includes a predetermined one of transmission loss, optical reflectivity, and dispersion.

17. The optical device analyzer according to claim 14, wherein the data processing module is further configured to de-embed the optical component characteristic from optical device measurements that include the optical component characteristic.

18. The optical device analyzer according to claim 14, wherein the data processing module is further configured to define a data window around the RBS on both sides of the optical component, and to adjust a size of the data windows to increase the number of data points available for averaging.

27. The optical device analyzer according to claim 14, further comprising a polarizer for varying a polarization state of the optical signal, wherein the data processing module is further configured to determine an optical component characteristic for each polarization state.

29. The optical device analyzer according to claim 27, wherein the minimum value and the maximum value of the optical component characteristic are determined using a preselected one of a Jones matrix and a Mueller matrix method

31. The optical device analyzer according to claim 14, wherein the signal processing unit is further configured to store information regarding different optical fibers in a lookup table, and the data processing module is further configured to use the stored information to adjust the optical component characteristic

33. The method according to claim 31, wherein the optical component characteristic includes a predetermined one of transmission loss, optical reflectivity, and dispersion

34. The method according to claim 31, further comprising defining a data window around the RBS on both sides of the optical component, and adjusting a size of the data windows to increase the number of data points available for averaging

35. The method according to claim 31, further comprising correcting for photoreceiver frequency response variation using a reference device under test.

36. The method according to claim 31, further comprising correcting for sweep non-linearity in the RBS using a reference interferometer.

37. The method according to claim 31, further comprising varying a polarization state of the optical signal and determining an optical component characteristic for each polarization state

38. The method according to claim 36, further comprising subtracting a minimum value of the optical component characteristic from a maximum value of the optical component characteristic to determine a polarization dependence of the optical component characteristic.

39. The method according to claim 37, wherein the minimum value and the maximum value of the optical component characteristic are determined using a preselected one of a Jones matrix and a Mueller matrix method.

40. The method according to claim 36, wherein the step of varying a polarization state is performed using a polarizer, further comprising determining an output power profile of the polarizer for each polarization state, and adjusting the optical component characteristic using the output power profile.

41. The method according to claim 33, further comprising storing information for different optical fibers in a lookup table, and using the information to adjust the optical component characteristic.

32. A method of de-embedding optical component characteristics from optical device measurements using Rayleigh backscatter (RBS), comprising.

sweeping an optical signal at a predefined sweep rate over a predefined wavelength range;

detecting the RBS on both sides of an optical component using an interferometric analyzer;

adjusting a wavelength range of the optical signal to increase a spatial resolution of the analyzer;

obtaining a frequency domain average or a frequency domain least square fit for the RBS on both sides of the optical component;

determining an optical component characteristic from the frequency domain average or the frequency domain least square fit; and

de-embedding the optical component characteristic from the optical device measurements.