Latent fault detection in redundant power supply systems
First Claim
1. A method of testing for latent faults in a redundant DC power supply system having at least two power supplies connected to a common load via respective isolation devices, each isolation device requiring a forward voltage to be equal to a respective forward bias voltage value to be operable in a normal conductive state, the method performed by a testing system comprising:
- selecting as a subject for a test procedure, one isolation device and its corresponding power supply;
controlling the power supplies during the test procedure to marginally vary the output voltage of at least one power supply such that a differential voltage is applied between the output of the selected power supply and the outputs of the remaining power supplies for selectively changing the conductive state of at least one isolation device to a non conductive state by reducing its forward voltage to less than its respective forward bias voltage value;
measuring current through the selected isolation device; and
determining whether the measured current is consistent with the existence of a fault condition in the selected isolation device.
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Accused Products
Abstract
Latent faults are detected by a testing system in a redundant DC power supply system having at least two power supplies connected to a common load via respective isolation devices. The testing system selects as a subject for a test procedure one isolation device and its corresponding power supply. The power supplies are controlled during the test procedure to marginally vary the output voltage of at least one power supply such that a differential voltage is applied between the output of the selected power supply and the outputs of the remaining power supplies for selectively changing the conductive state of at least one isolation device to a non conductive state by reducing its forward voltage to less than its respective forward bias voltage value.
25 Citations
31 Claims
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1. A method of testing for latent faults in a redundant DC power supply system having at least two power supplies connected to a common load via respective isolation devices, each isolation device requiring a forward voltage to be equal to a respective forward bias voltage value to be operable in a normal conductive state, the method performed by a testing system comprising:
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selecting as a subject for a test procedure, one isolation device and its corresponding power supply;
controlling the power supplies during the test procedure to marginally vary the output voltage of at least one power supply such that a differential voltage is applied between the output of the selected power supply and the outputs of the remaining power supplies for selectively changing the conductive state of at least one isolation device to a non conductive state by reducing its forward voltage to less than its respective forward bias voltage value;
measuring current through the selected isolation device; and
determining whether the measured current is consistent with the existence of a fault condition in the selected isolation device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A testing system for testing for latent faults in a redundant DC power supply system having at least two power supplies connected to a common load via respective isolation devices, each isolation device requiring a forward voltage to be equal to a respective forward bias voltage value to be operable in a normal conductive state, the testing system comprising:
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a system controller for selecting as a subject for a test procedure, one isolation device and its corresponding power supply;
control circuitry for controlling the power supplies during the test procedure to marginally vary the output voltage of at least one power supply such that a differential voltage is applied between the output of the selected power supply and the outputs of the remaining power supplies for selectively changing the conductive state of at least one isolation device to a non conductive state by reducing its forward voltage to less than its respective forward bias voltage value;
measuring circuitry for measuring current through the selected isolation device; and
wherein the system controller is operable to determine whether the measured current is consistent with the existence of a fault condition in the selected isolation device. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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27. A system comprising:
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a load circuit;
a plurality of DC power supplies each having a respective isolation device via which the power supply is connected to the load circuit, each isolation device requiring a forward voltage to be equal to a respective forward bias voltage value to be operable in a normal conductive state; and
a test system for testing for latent faults, the test system comprising;
a system controller for selecting as a subject for a test procedure, one isolation device and its corresponding power supply;
control circuitry for controlling the power supplies to marginally vary the output voltage of at least one power supply such that a differential voltage is applied between the output of the selected power supply and the outputs of the remaining power supplies for selectively changing the conductive state of at least one isolation device to a non-conductive state by reducing its forward voltage to less than its respective forward bias voltage value;
measuring circuitry for measuring current through the selected isolation device; and
wherein the system controller is operable to determine whether the measured current is consistent with the existence of a fault condition in the selected isolation device. - View Dependent Claims (28, 29)
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30. A portable storage medium carrying processor implementable instructions for instructing a processor to control a testing system to perform a method of testing for latent faults in a redundant DC power supply system having at least two power supplies connected to a common load via respective isolation devices, each isolation device requiring a forward voltage to be equal to a respective forward bias voltage value to be operable in a normal conductive state, the method performed by the testing system comprising:
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selecting as a subject for a test procedure, one isolation device and its corresponding power supply;
controlling the power supplies during the test procedure to marginally vary the output voltage of at least one power supply such that a differential voltage is applied between the output of the selected power supply and the outputs of the remaining power supplies for selectively changing the conductive state of at least one isolation device to a non conductive state by reducing its forward voltage to less than its respective forward bias voltage value;
measuring current through the selected isolation device; and
determining whether the measured current is consistent with the existence of a fault condition in the selected isolation device.
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31. A signal carrying processor implementable instructions for instructing a processor to control a testing system to perform a method of testing for latent faults in a redundant DC power supply system having at least two power supplies connected to a common load via respective isolation devices, each isolation device requiring a forward voltage to be equal to a respective forward bias voltage value to be operable in a normal conductive state, the method performed by a testing system comprising:
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selecting as a subject for a test procedure, one isolation device and its corresponding power supply;
controlling the power supplies during the test procedure to marginally vary the output voltage of at least one power supply such that a differential voltage is applied between the output of the selected power supply and the outputs of the remaining power supplies for selectively changing the conductive state of at least one isolation device to a non conductive state by reducing its forward voltage to less than its respective forward bias voltage value;
measuring current through the selected isolation device; and
determining whether the measured current is consistent with the existence of a fault condition in the selected isolation device.
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Specification