Substrate for material to be exposed

• US 20040047057A1
• Filed: 06/13/2003
• Published: 03/11/2004
• Est. Priority Date: 12/14/2000
• Status: Abandoned Application

• Current Assignee: Commissariat a L'Energie Atomique (AES Corporation), Biomerieux SA (Compagnie Merieux Alliance SAS)
• Original Assignee: Commissariat a L'Energie Atomique (AES Corporation), Biomerieux SA (Compagnie Merieux Alliance SAS)
• Inventors: Pouteau, Patrick, Chaton, Patrick, Perraut, Francois
• Application Number:
  US10/450,386
• Publication Number:
  US 20040047057A1
• Time in Patent Office: Days
• US Class Current: 359/883
• CPC Class Codes: B01J 2219/00497 Features relating to the solid phase supports
• CPC Class Codes: B01J 2219/00596 Solid-phase processes
• CPC Class Codes: B01J 2219/00605 the compounds being directly bound or immobilised to solid supports
• CPC Class Codes: B01J 2219/00612 the surface being inorganic
• CPC Class Codes: B01J 2219/00711 Light-directed synthesis
• CPC Class Codes: B82Y 30/00 Nanotechnology for materials or surface science, e.g. nanocomposites
• CPC Class Codes: G03F 7/09 characterised by structural details, e.g. supports, auxiliary layers supports for printing plates in general B41N
• CPC Class Codes: G03F 7/20 Exposure; Apparatus therefor photographic printing apparatus for making copies G03B27/00

Abstract

This invention relates to a substrate (1) with a reception surface (4) for a layer of material to be insolated by insolation light, wherein means forming a mirror (3) are arranged between said reception surface (4) and the layer of material to be insolated, these means forming a mirror (3) operating for the wavelength of the insolation light. This type of substrate may be used for making microelectronic or microtechnological devices, or biochips.

Claims

1. Substrate (1) with a reception surface (4) for a layer of material to be insolated by insolation light, characterised in that means forming a mirror (3) are arranged between said reception surface (4) and the layer of material to be insolated, these means forming a mirror (3) operating for the wavelength of the insolation light.

2. Substrate according to claim 1, characterised in that the means forming a mirror (3) for the insolation wavelength are also designed for the transmission of a light beam to use the devices made on the substrate.

3. Substrate according to claim 2, characterised in that the substrate (1) is capable of transmitting a luminescence signal, and the means forming a mirror (3) have a refraction index greater than the refraction index of the substrate, and their thickness is chosen to transmit all or some of the luminescence signal that is thus amplified.

4. Substrate according to claim 1, characterised in that the means forming a mirror (3) comprise one or several optical layers.

5. Substrate according to claim 4, characterised in that the means forming a mirror (3) comprise several optical layers including a Bragg structure type stack.

6. Substrate according to claim 5, characterised in that each optical layer in the stack may have an optical thickness (in other words the product of the refraction index of a layer by its mechanical thickness) equal to a quarter of the wavelength of the insolation light.

7. Substrate according to claim 5, characterised in that the thickness of each optical layer in the stack is calculated such that the means forming a mirror reflect at least 95% of the insolation light and transmit most of an operations light beam, about 8% of this operations light beam being reflected.

8. Substrate according to any one of claims 1 to 7, characterised in that the means forming a mirror are composed of one or several materials chosen from among TiO₂, HfO₂, TaO₅, SiO₂, SiC, amorphous Si, YF₃, MgF₂ and LiF.

9. Substrate according to claim 5, characterised in that said stack is composed of an alternation of HfO₂ and SiO₂ layers.

10. Substrate according to claim 9, characterised in that the stack is terminated on the side opposite the substrate by a layer of SiO₂.

11. Substrate according to claim 1, characterised in that it is composed of a silicon or borosilicate support, or a support made of polymer(s), borosilicated or non-borosilicated glass, or silica supporting the means forming a mirror.

12. Microelectronic device, characterised in that it is made on a substrate according to any one of the above claims.

13. Microtechnological device, characterised in that it is made on a substrate according to any one of claims 1 to 11.

14. Biochip, characterised in that it is made on a substrate according to any one of claims 1 to 11.

15. Process for making a microelectronic or microtechnological device or a biochip from a substrate, the process comprising the formation of a layer of material to be insolated on a reception surface of the substrate, the process also comprising, after insolation of said layer, subsequent steps of the realization of the microelectronic or microtechnological device or the biochip characterised in that the process comprises the formation of means forming a mirror at said reception surface, that function for the wavelength of the insolation light of the layer to be insolated, before formation of the layer of material to be insolated.

16. Process according to claim 15, characterised in that the layer to be insolated is a photosensitive resin or a layer comprising photosensitive molecules involved in procedures for photodeprotection or photoactivation of the treatment, or the use of a biochip.

17. Process according to claim 15, characterised in that it comprises a step after insolation of said layer of material, consisting of eliminating all or some of the means forming a mirror.

18. Process according to claim 17, characterised in that all or some of the means forming a mirror are eliminated during subsequent steps to make the microelectronic or microtechnological device or the biochip.

19. Process according to claim 15, characterised in that the means forming a mirror are formed by deposition of layers superposed on a support, the free face of the superposed layers forming the reception surface of the substrate.