Process monitor based keeper scheme for dynamic circuits
First Claim
1. A semiconductor die having adaptive keeper logic, comprising:
- a plurality of dynamic circuits, each dynamic circuit including an adaptive keeper circuit capable of being adjusted based on a bit code;
a plurality of process monitors, each process monitor disposed within a corresponding die block defining a local area of the die, each process monitor capable of detecting process corner data for the corresponding die block; and
a test processor unit in communication with each process monitor and the plurality of dynamic circuits, the test processor unit being capable of obtaining process corner data for each die block from the process monitor disposed within the die block and providing a bit code based on the process corner data to dynamic circuits disposed within the same die block.
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Abstract
An invention is disclosed for a process monitor based keeper scheme for dynamic circuits. A semiconductor die having a process monitor based keeper scheme of the embodiments of the present invention generally includes a plurality of dynamic circuits, each having an adaptive keeper circuit capable of being adjusted based on a bit code. In addition, a plurality of process monitors is included. Each process monitor is disposed within a corresponding die block, which defines a local area of the die. The process monitors are capable of detecting process corner data for the corresponding die block. In communication with each process monitor and the plurality of dynamic circuits is a test processor unit. The test processor unit obtains process corner data for each die block from the process monitor disposed within the die block, and provides a bit code based on the process corner data to the dynamic circuits disposed within the die block.
16 Citations
20 Claims
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1. A semiconductor die having adaptive keeper logic, comprising:
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a plurality of dynamic circuits, each dynamic circuit including an adaptive keeper circuit capable of being adjusted based on a bit code;
a plurality of process monitors, each process monitor disposed within a corresponding die block defining a local area of the die, each process monitor capable of detecting process corner data for the corresponding die block; and
a test processor unit in communication with each process monitor and the plurality of dynamic circuits, the test processor unit being capable of obtaining process corner data for each die block from the process monitor disposed within the die block and providing a bit code based on the process corner data to dynamic circuits disposed within the same die block. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. An adaptive keeper circuit disposed within a die block defining a local area of a die, comprising:
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a first keeper transistor having a first terminal in electrical communication with a power supply and a second terminal in electrical communication with an internal dynamic node;
a second keeper transistor configured in parallel to the first keeper transistor, the second keeper transistor having a first terminal in electrical communication with the power supply; and
a feedback bit line configured to control current flow between the second keeper transistor and the internal dynamic node based on a state of the feedback bit line, the state of the feedback bit line being based on a process corner characteristic the die block. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. A method for optimizing a keeper circuit for use in a dynamic circuit, comprising the operations of:
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defining a plurality of die blocks defining a local area of the die;
obtaining process corner data for each die block;
translating the process corner data for each die block into a corresponding bit code, the bit code indicating a process corner of the die block; and
adding particular secondary keeper transistors to a first keeper transistor, the particular secondary keeper transistors being selected using the bit code. - View Dependent Claims (17, 18, 19, 20)
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Specification