Analysis apparatus and analysis method

• US 20040059507A1
• Filed: 08/20/2003
• Published: 03/25/2004
• Est. Priority Date: 08/30/2002
• Status: Active Grant

• Current Assignee: Hitachi High-Tech Science Corporation (Hitachi, Ltd.)
• Original Assignee: SII NanoTechnology Inc. (Hitachi, Ltd.)
• Inventors: Nagasawa, Jun
• Granted Patent: US 6,901,349 B2
• Time in Patent Office: Days
• US Class Current: 702/2
• CPC Class Codes: G01V 13/00 Manufacturing, calibrating, cleaning, or repairing instruments or devices covered by groups G01V1/00 – G01V11/00

Abstract

In order to provide an analysis apparatus capable of designating arbitrary calibration conditions for each measurement when a plurality of types of measurement are carried out using an autosampler etc., there is provided a measurement head 10 for measuring sample characteristics; storage means 23 for storing calibration conditions made by performing device calibration in advance; a measurement sequence 22 capable of setting calibration conditions used in each measurement step; designation means 21 for designating calibration conditions for each measurement step; and measurement control means for controlling a series of measurements in accordance with a measurement sequence, for carrying out measurement after first setting calibration conditions designated for each measurement step at the measurement head when executing each measurement step.

Claims

1. An analysis apparatus comprising:

a measurement head for measuring sample characteristics;

a calibration conditions file comprising at least one calibration condition made by carrying out device calibration for the measurement head in advance;

designation means for designating one of the calibration conditions within the calibration conditions file;

a measurement sequence comprising a sequence for a plurality of measurement steps comprising measurement conditions for carrying out measurements and calibration conditions designated by the designation means; and

measurement means for referring to each measurement step of the measurement sequence and carrying out measurement after inputting measurement conditions and calibration conditions for each measurement step to the measurement head.

2. The analysis apparatus according to claim 1, further comprising means for saving calibration conditions made by carrying out device calibration on the measurement head in advance as a file in the calibration conditions file and designating calibration conditions used in each measurement step in the measurement sequence using a calibration conditions file name.

3. The analysis apparatus according to claim 1, characterized by a thermal analysis apparatus equipped with a furnace for heating a sample at the measurement head and measuring physical characteristics of the sample while changing temperature.

4. The analysis apparatus according to claim 2, characterized by a thermal analysis apparatus equipped with a furnace for heating a sample at the measurement head and measuring physical characteristics of the sample while changing temperature.