X-ray sensor and x-ray ct apparatus comprising it

• US 20040062351A1
• Filed: 09/30/2003
• Published: 04/01/2004
• Est. Priority Date: 06/12/2000
• Status: Abandoned Application

• Current Assignee: Hitachi Medical Corporation (Hitachi, Ltd.)
• Original Assignee: Hitachi Medical Corporation (Hitachi, Ltd.)
• Inventors: Yoshioka, Tomonori
• Application Number:
  US10/297,810
• Publication Number:
  US 20040062351A1
• Time in Patent Office: Days
• US Class Current: 378/98.8
• CPC Class Codes: A61B 6/032 Transmission computed tomography [CT]
• CPC Class Codes: A61B 6/4085 Cone-beams
• CPC Class Codes: A61B 6/5205 involving processing of raw data to produce diagnostic data

Abstract

To provide an X-ray detector for performing highly accurate measurement eliminating measurement errors and a multi-slice X-ray CT apparatus for obtaining a reconstructed image with high diagnosability using said X-ray detector, an X-ray detecting element array is comprised of a scintillator and a light detecting element array with a switching circuit, which is formed with a light detecting element array having light-reception area that is divided in the channel direction and in the slicing direction, and a switching element array for routing a plurality of outputs of said light-reception area divided in the slicing direction, and then connecting these outputs to an external circuit. A switching circuit of said switching element array connects outputs of selected lines of the elements in the same slicing direction on the light detecting element array to an external circuit, and connects the outputs of lines of elements in the slicing direction that are not used for measurement to the common ground potential of said light detecting element array. An X-ray detector is constructed with a plurality of X-ray detecting element arrays polygonally arranged on an arcuate line centered at the focal point of the X-ray tube with a uniform angular pitch in the channel and slicing directions. A plurality of tomograms can be obtained at one time from the data of the intensity of X-rays detected with said X-ray detector.

Claims

1. An X-ray detector comprising:

a scintillator which generates light when it detects incident X-rays; and

an light detecting element array with a switching circuit, which comprises an light detecting element array having light-reception area that are divided in the channel direction and in the slicing direction, and a switching element array for routing a plurality of outputs of said light-reception area that are divided in the slicing direction and connecting these outputs to an external circuit,

said scintillator and X-ray detecting element array with a switching circuit being polygonally arranged on an arcuate line centered at the focal point of the X-ray tube with a uniform angular pitch in the channel direction and in the slicing direction,

wherein said switching circuit connects the outputs of selected lines of the elements in the slicing direction of the light detecting element array to an external circuit, and connects the outputs of lines of elements in the slicing direction that are not used for measurement to the common ground potential of said light detecting element array.

2. An X-ray detector according to claim 1, wherein all the channels of said switching circuit simultaneously output signals to said external circuit, after combining rows of cells in the same slicing direction according to a slicing thickness selecting signal input from an external circuit.

3. An X-ray detector according to claim 2, wherein said switching circuit comprises a plurality of semiconductor switching elements and a switching element driving signal generating circuit for driving said switching elements. And, connection/disconnection of said switching elements is controlled by said slice thickness selecting signal.

4. An X-ray detector according to claim 3, wherein cells of said light detecting element array and said switching elements are symmetrically arranged, and output signals of the cells that are not divided in the combination corresponding to the selected slice thickness are sent before the cells input said signals to the switching elements, and also, pairs of said switching elements symmetric to each other operate in the same way, and as well the output of all cells are symmetrically connected to the external circuit.

5. An X-ray CT apparatus comprising:

an X-ray tube for radiating an X-ray beam to an object to be examined;

an X-ray detector for detecting X-rays that have been transmitted through the object and converting the detected X-rays into electric signals, this X-ray detector being arranged opposite to said X-ray tube;

a preamplifier for amplifying the output signals of said X-ray detector,

an AD converter for converting the analog signals outputted from said preamplifier into digital signals;

a rotating plate for holding at least said X-ray tube and said X-ray detector, this circular plate being driven to rotate around the object;

a scanning condition setting means for setting scanning conditions; and

an image processing means for reconstructing an X-ray image in accordance with the output of said AD converter,

wherein said X-ray detector comprises;

a scintillator which generates light when it detects incident X-rays; and

a light detecting element array with a switching circuit, which comprises an light detecting element array having light-reception area that is divided in the channel direction and in the slicing direction, and a switching element array for routing a plurality of outputs of said light-reception area that are divided in the slicing direction and connecting these outputs to said preamplifier, said scintillator and X-ray detecting element array with a switching circuit being polygonally arranged on an arcuate line centered at the focal point of the X-ray tube with a uniform angular pitch,

wherein said switching circuit connects to said preamplifier the outputs of lines of the elements in the slicing direction of the light detecting element array according to the slice thickness selection signal set by said scanning condition setting means, and connects the output of lines of slicing elements that are not used for measurement to the common ground potential of said light detecting element array.

6. An X-ray CT apparatus according to claim 5, wherein all the channels of said switching circuit simultaneously output signals to said preamplifier after combining rows of cells in the slicing direction according to the slicing thickness selecting signal from said scanning condition setting means.

7. An X-ray CT apparatus according to claim 6, wherein said switching circuit comprises a plurality of semiconductor switching elements and a switching element driving signal generating circuit for driving said switching elements, connection/disconnection of said switching elements being controlled by said slice thickness selecting signal.

8. An X-ray CT apparatus according to claim 7, wherein cells of said light detecting elements and said switching elements are symmetrically arranged, and output signals of cells that are not divided in the combination corresponding to the selected slice thickness are sent before the cells output said signals to the switching elements, and each pair of said switching elements symmetric to each other operates in the same way, and further, the output of each cell is symmetrically connected to said preamplifier.