Apparatus for testing infrared camera

• US 20040066965A1
• Filed: 09/30/2003
• Published: 04/08/2004
• Est. Priority Date: 10/02/2002
• Status: Active Grant

• Current Assignee: Honda Giken Kogyo Kabushiki Kaisha (Honda Motor Company)
• Original Assignee: Honda Giken Kogyo Kabushiki Kaisha (Honda Motor Company)
• Inventors: Saka, Masakazu, Tsuji, Takayuki, Nagaoka, Nobuharu, Hattori, Hiroshi, Watanabe, Masahito, Takatsudo, Izumi
• Granted Patent: US 7,418,127 B2
• Time in Patent Office: Days
• US Class Current: 382/154
• CPC Class Codes: H04N 13/246 Calibration of cameras
• CPC Class Codes: H04N 17/002 for television cameras
• CPC Class Codes: H04N 23/20 for generating image signals from infrared radiation only
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

An apparatus for testing infrared cameras includes: a front plate which has holes arranged in line, and which is adapted to emit an amount of infrared light; and a back plate which is disposed in parallel to and behind the front plate as viewed from infrared cameras to be tested, and which is adapted to emit a different amount of infrared light when compared with the front plate. The back plate is disposed at lower portions of pillars. On the other hand, the front plate is made vertically movable in front of the back plate and along the pillars. By being controlled by a controller, the front plate is movable from the ground height to a level corresponding to approximately two times the height of the back plate.

Claims

1. An apparatus for testing infrared cameras, comprising:

a cover plate which has holes arranged in line, and which is adapted to emit an amount of infrared light; and

an emission source which is disposed in parallel to and behind the cover plate as viewed from infrared cameras to be tested, and which is adapted to emit a different amount of infrared light when compared with the cover plate.

2. An apparatus for testing infrared cameras, according to claim 1, wherein the emission source comprises a metal plate, and a heat source which is connected to the metal plate.

3. An apparatus for testing infrared cameras according to claim 1, wherein the emission source comprises a metal plate, and an element which is adhered to the metal plate, and which has an infrared emissivity that is higher than that of the cover plate.

4. An apparatus for testing infrared cameras, according to claim 1, wherein the cover plate has been subjected to a processing for reducing infrared reflection.

5. An apparatus for testing infrared cameras, according to claim 1, wherein the cover plate is vertically movable in front of the emission source as viewed from the infrared cameras to be tested from a first position at which testing of the infrared cameras is executed to a second position which is higher than the first position.

6. An apparatus for testing infrared cameras, according to claim 5, wherein the second position is sufficiently higher than the first position such that the cover plate is not heated by a heat source of the emission source.