Apparatus and method for determining the performance of micromachined or microelectromechanical devices (MEMS)
First Claim
1. An apparatus for determining the performance of at least one micromachined or microelectromechanical systems device (MEMS device) intended to carry a high frequency signal having an intended working frequency, the device comprising a capacitive structure with at least one movable part, the apparatus comprising:
- means for providing a voltage signal;
at least one voltage divider circuit comprising, in series with the means for providing the voltage signal, an impedance, an outlet and the capacitive structure; and
means for detecting and measuring the voltage at the outlet of the voltage divider, wherein the means for providing the voltage signal is arranged for providing a combined voltage signal of an actuation voltage able to act on the moveable part of the capacitive structure with an actuation frequency and of a measurement voltage, the measurement voltage having a measurement frequency lower than the intended working frequency.
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Abstract
An apparatus for determining the performances of at least one micromachined or microelectromechanical device (MEMS device) intended to carry a high frequency signal having an intended working frequency is disclosed. The MEMS device comprises a capacitive structure with at least one movable part, able to move with a frequency. The apparatus comprises a voltage signal source, at least one voltage divider circuit arranged between the capacitive structure and the voltage signal source, and a detection unit for detecting and measuring the voltage at the outlet of the voltage divider. The detection unit provides a combined voltage signal of an actuation voltage able to act on the moveable part of the capacitive structure with an actuation frequency and of a measurement voltage having a measurement frequency lower than the intended working frequency.
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Citations
41 Claims
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1. An apparatus for determining the performance of at least one micromachined or microelectromechanical systems device (MEMS device) intended to carry a high frequency signal having an intended working frequency, the device comprising a capacitive structure with at least one movable part, the apparatus comprising:
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means for providing a voltage signal;
at least one voltage divider circuit comprising, in series with the means for providing the voltage signal, an impedance, an outlet and the capacitive structure; and
means for detecting and measuring the voltage at the outlet of the voltage divider, wherein the means for providing the voltage signal is arranged for providing a combined voltage signal of an actuation voltage able to act on the moveable part of the capacitive structure with an actuation frequency and of a measurement voltage, the measurement voltage having a measurement frequency lower than the intended working frequency. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method of determining the performance of at least one micromachined or microelectromechanical systems device (MEMS device), capable of carrying a high frequency signal having an intended working frequency, and comprising a capacitive structure with at least one movable part, comprising:
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providing a voltage signal;
applying the voltage signal to at least one voltage divider circuit comprising, an impedance, an outlet and the capacitive structure; and
detecting and measuring the voltage at the outlet of the voltage divider;
wherein the voltage signal is a combined voltage signal of an actuation voltage able to act on the moveable part of the capacity structure with an actuation frequency and a measurement voltage, the measurement voltage having a measurement frequency lower than the intended working frequency. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21)
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22. An apparatus for determining the performance of at least one micromachined or microelectromechanical systems device (MEMS device) intended to carry a high frequency signal having an intended working frequency, the device comprising a capacitive structure with at least one movable part, the apparatus comprising:
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a voltage signal source;
at least one voltage divider circuit comprising, in series with the voltage signal source, an impedance, an outlet and the capacitive structure; and
a detection unit configured to detect and measure the voltage at the outlet of the voltage divider;
wherein the detection unit is configured to provide a combined voltage signal of an actuation voltage able to act on the moveable part of the capacitive structure with an actuation frequency and of a measurement voltage, the measurement voltage having a measurement frequency lower than the intended working frequency. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29)
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30. A test system for a micromachined or microelectromechanical systems (MEMS) device, comprising:
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a detection unit having inputs for an actuation signal, a measurement signal, and a MEMS output signal, and having ouputs for a MEMS input signal and a test result signal; and
a test unit configured to feed the received MEMS input signal to a voltage divider circuit connectable to a MEMS device, and to feed the MEMS output signal to the detection unit. - View Dependent Claims (31, 32, 33, 34, 35, 36, 37, 38, 39)
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40. A test system for a micromachined or microelectromechanical systems (MEMS) device configured to transmit high frequency signals, comprising:
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a voltage signal source, at least one voltage divider circuit, connected in series with the voltage signal source, and being connectable to a MEMS device; and
a detection unit configured to detect and measure the voltage output by the voltage divider;
wherein the detection unit is configured to provide a combined voltage signal of an actuation voltage capable of the actuating the MEMS and of a measurement voltage. - View Dependent Claims (41)
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Specification