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Non-contact tester for electronic circuits

  • US 20040075453A1
  • Filed: 09/19/2003
  • Published: 04/22/2004
  • Est. Priority Date: 09/19/2002
  • Status: Active Grant
First Claim
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1. A non-contact tester for electronic circuits, comprising in combination:

  • an electronic circuit which includes at least one wireless i/o cell and means for sending and receiving signals via the at least one wireless i/o cell; and

    an independent scanning head having at least one wireless i/o cell compatible with the at least one wireless i/o cell on the electronic circuit, such that data may be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.

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