Method and device for positioning a slice level of an x-ray exposure
First Claim
Patent Images
1. A method for positioning a level of a slice of an X-ray exposure to be generated by irradiating a subject in an examination direction, said method comprising the steps of:
- obtaining a reference image of an exterior of a subject with a camera along a line of sight transverse to said examination direction;
indicating a selected slice level with a marking in said reference image; and
using said marking in said reference image to set a slice level when irradiating the subject with X-rays with an X-ray examination device.
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Abstract
In a method and device for positioning the level of a slice during the generation of a slice exposure of an examination subject with an x-ray examination device, a reference image of the exterior of the examination subject is recorded by a camera on a line of sight proceeding transverse to the direction of examination. The slice level of a subsequent slice exposure is determined using a slice level marking within the reference image.
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Citations
16 Claims
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1. A method for positioning a level of a slice of an X-ray exposure to be generated by irradiating a subject in an examination direction, said method comprising the steps of:
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obtaining a reference image of an exterior of a subject with a camera along a line of sight transverse to said examination direction;
indicating a selected slice level with a marking in said reference image; and
using said marking in said reference image to set a slice level when irradiating the subject with X-rays with an X-ray examination device. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A slice level positioning device for positioning a level of a slice of an X-ray exposure to be generated by irradiating a subject in an examination direction, comprising:
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a camera for obtaining a reference image of an exterior of a subject along a line of sight transverse to said examination direction;
an indication unit indicating a selected slice level with a marking in said reference image; and
a processor for, using said marking in said reference image, setting a slice level when irradiating the subject with X-rays with an X-ray examination device. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. An X-ray examination device allowing positioning of a level of a slice of an X-ray exposure comprising:
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an X-ray source for irradiating a subject in an examination direction to produce an X-ray exposure;
a camera for obtaining a reference image of an exterior of the a subject along a line of sight transverse to said examination direction;
an indication unit for indicating a selected slice level with a marking in said reference image; and
a processor for using said marking in said reference image setting a slice level when irradiating the subject with X-rays with the X-ray source.
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Specification