Method and system for extending delay and slew metrics to ramp inputs
First Claim
1. A method of determining a circuit response from a ramp input of a resistive-capacitive (RC) circuit, comprising the steps of:
- calculating a first circuit response parameter using a given circuit response metric based on a step input for the RC circuit;
calculating a second circuit response parameter, different from the first circuit response parameter, using the circuit response metric based on a step input for the RC circuit;
extending the circuit response metric to the ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response.
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Accused Products
Abstract
A method of determining a circuit response (such as delay or slew) from a ramp input of an RC circuit calculates two circuit response parameters using a given circuit response metric based on a step input for the RC circuit, and extends the circuit response metric to a ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response. The novel technique is based on the use of probability distribution functions and cumulative distribution functions to characterize the impulse response of the RC circuit, and the calculating steps derive the first and second circuit response parameters from such statistical distribution functions. In particular, the calculating steps may use a standard deviation or a mean of a probability distribution function corresponding to the circuit response parameter. In one application, the invention is used to estimate delay response for the ramp input of the RC circuit. In another application, the invention is used to estimate output slew for the ramp input of the RC circuit. The invention may be used to extend any valid delay or slew metric.
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Citations
24 Claims
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1. A method of determining a circuit response from a ramp input of a resistive-capacitive (RC) circuit, comprising the steps of:
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calculating a first circuit response parameter using a given circuit response metric based on a step input for the RC circuit;
calculating a second circuit response parameter, different from the first circuit response parameter, using the circuit response metric based on a step input for the RC circuit;
extending the circuit response metric to the ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A data processing system for determining a circuit response from a ramp input of a resistive-capacitive (RC) circuit, comprising:
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means for processing program instructions;
a memory device connected to said processing means; and
program instructions stored in said memory device for calculating a first circuit response parameter using a given circuit response metric based on a step input for the RC circuit, calculating a second circuit response parameter different from the first circuit response parameter using the circuit response metric based on a step input for the RC circuit, and extending the circuit response metric to the ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A computer program product for determining a circuit response from a ramp input of a resistive-capacitive (RC) circuit, comprising:
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a computer-readable medium; and
program instructions residing in said medium for calculating a first circuit response parameter using a given circuit response metric based on a step input for the RC circuit, calculating a second circuit response parameter different from the first circuit response parameter using the circuit response metric based on a step input for the RC circuit, and extending the circuit response metric to the ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24)
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Specification