Method and apparatus for telemetered probing of integrated circuit operation
First Claim
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1. An integrated circuit fabricated and tested according to a method comprising the steps of:
- identifying a plurality of test points within the integrated circuit;
capturing the electrical state present at the test points;
incorporating the electrical state present at the test points into a telemetry stream;
modulating an output signal according to the telemetry stream; and
emitting energy from a transducer driven by the output signal.
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Abstract
State of test points on an integrated circuit are encapsulated in a telemetry frame that is wirelessly conveyed to a test system. Test points may be logic levels or analog levels converted into representative multi-bit values. Conveyance off the circuit may be by radio frequency or optical emission.
20 Citations
24 Claims
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1. An integrated circuit fabricated and tested according to a method comprising the steps of:
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identifying a plurality of test points within the integrated circuit;
capturing the electrical state present at the test points;
incorporating the electrical state present at the test points into a telemetry stream;
modulating an output signal according to the telemetry stream; and
emitting energy from a transducer driven by the output signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An integrated circuit comprising:
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application specific circuitry comprising a plurality of test points;
test point capture circuit that captures the electrical state of the predefined test points;
telemetry formatter that creates a telemetry stream by incorporating the captured electrical state of the test points;
modulator that generates a modulated output signal according to the telemetry stream; and
transducer that emits energy according to the modulated output signal. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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Specification