Fluid delivery for scanning probe microscopy
First Claim
1. A micro electromechanical systems (MEMS) device comprising:
- a scanning probe microscopy (SPM) component; and
one or more fluidic channels formed in the SPM component.
3 Assignments
0 Petitions
Accused Products
Abstract
The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or nanotool™ to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging due to the action of the probe or nanotools and to provide vacuum at and around the tip and substrate area. The invention can also produce electrical current for use with active electronic devices on, in or near the body of the device. In addition by use of a fluid like water, certain oils, and other liquids in conjunction with specific tip structure either electric discharge machining can be used at the tip area on the tip itself (in conjunction with a form structure on the work piece) or on a work piece beneath the tip to shape, polish and remove material at very small scales (10 microns to 1 nm or less).
121 Citations
35 Claims
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1. A micro electromechanical systems (MEMS) device comprising:
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a scanning probe microscopy (SPM) component; and
one or more fluidic channels formed in the SPM component. - View Dependent Claims (2, 16)
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3. A micro electromechanical systems (MEMS) device comprising:
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a scanning probe microscopy (SPM) component;
at least one fluidic channel formed in the SPM component; and
a venturi tube formed along a portion of the fluidic channel, wherein a vacuum can be developed by a flow of a gas or fluid through venturi tube.
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4. A micro electromechanical systems (MEMS) device comprising:
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scanning probe microscopy (SPM) component;
a fluidic channel formed in the SPM component, the fluidic channel configured to deliver fluid to a tip of the SPM component;
an amount of an isotope disposed along the fluidic channel, wherein the particles emitted by the isotope can be delivered by a fluid flowing in the fluidic channel to the tip to affect the charge distribution in a region about the tip. - View Dependent Claims (5, 8, 9, 10, 15, 25, 31, 32, 33, 34, 35)
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6. A micro electromechanical systems (MEMS) device comprising:
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scanning probe microscopy (SPM) component;
an amount of an isotope disposed on the SPM component;
a circuit for collecting particles emitted from the isotope to store an accumulated charge; and
a contact formed on the circuit to provide an amount of current that can be produced from the accumulated charge. - View Dependent Claims (7)
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11. Any nanocavitation technique which uses an nanocavitation inducing member to image or measure the surface to which the cavitation is to interact with by a Scanning Probe Microscopy Method.
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12. Any nanoelectric discharge machining in which the electric discharge tool also serves to image or measure the surface to be machined by any Scanning Probe Microscopy Method.
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13. Any outflow, inflow, circulating or recirculating fluid system in which the Scanning Probe Microscopy means is integrated with the fluid transfer means.
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14. Any outflow, inflow, circulating or recirculating fluid system in which nanomachining or surface modification by any means is conducted by a means integrated with said means.
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17. The device as described in 16 above in which the fluid channel also functions as an active mechanical or electromechanical member.
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18. The device as described in 16 above in which the movable members act as passive elements.
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19. The device as described in 16 above in which the movable members act as passive elements and are activated or operated by external mechanical, vacuum, or fluid induced forces.
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20. The device as described in 16 above in which the movable members act independently to provide new functions.
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21. The device as described in 16 above in which the movable members act independently to provide scanning or motion for any reason in or near the plane of the cantilever.
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22. The device as claimed in 4 which is a composed of a diode or electrically similar region in close proximity to the emitted radiation.
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23. Any system for Scanning Probe Microscopy, Nanomachining, Nanomanipulation, or multimode operation in which the mechanical, electrical, electro-optical, radiological, are changed by mechanical or electrical means.
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24. Any system for Scanning Probe Microscopy, Nanomachining, Nanomanipulation, or multimode operation in which the modality of operation is obtained by use of mecahnical members interacting with or substituting for the primary sense or interaction structure.
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26. Any application, measurement or operation in which the device of 10 acts in a specific or constrained region.
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27. Any application, measurement or operation as in 26 in which the application uses chemical or biological chips or devices in which material for the operation, application or measurement is placed in wells in a regular arrangement on a plane or surface(s).
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28. Any application, measurement or operation as in 26 in which the target material is DNA which has been marked optically, electrically or chemically so as to interact with optical, electrical or chemical detectors or emitters associated with or integrated in the device.
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29. The device as described in 16 above in which the movable members act independently and are electrically sensed and this information or sense current or voltage used to control the movable members.
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30. The device as described in 16 above in which the movable members act independently and are electrically sensed and this information or sense current or voltage used to obtain a particular motion or displacement of the structure the arms act on including obtaining zero displacement.
Specification