Analyte test intrument having improved versatility
First Claim
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1. An analyte test instrument suitable for performing an assay with a test strip, said analyte test instrument comprising:
- (a) a test port for receiving a test strip;
(b) a microprocessor for executing instructions downloaded into said instrument; and
(c) a test strip circuit capable of having a plurality of configurations, said configurations being set by said microprocessor, whereby an assay can be performed using said test strip.
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Abstract
An analyte test instrument that has a test strip circuitry that can be configured using information provided by a calibration strip to perform assays with test strips having two electrodes and test strips having three electrodes. The analyte test instrument of this invention comprises:
(a) a test port for receiving a test strip;
(b) a microprocessor for executing instructions downloaded into the analyte test instrument;
(c) a test strip circuit capable of having a plurality of configurations, the configurations being set by the microprocessor, whereby an assay can be performed using the test strip.
105 Citations
46 Claims
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1. An analyte test instrument suitable for performing an assay with a test strip, said analyte test instrument comprising:
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(a) a test port for receiving a test strip;
(b) a microprocessor for executing instructions downloaded into said instrument; and
(c) a test strip circuit capable of having a plurality of configurations, said configurations being set by said microprocessor, whereby an assay can be performed using said test strip. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. An analyte test instrument suitable for performing an assay with a test strip, said analyte test instrument comprising:
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(a) a test port for receiving a test strip;
(b) a microprocessor for executing instructions downloaded into said instrument; and
(c) a test strip circuit capable of having a plurality of configurations, said configurations being set by said microprocessor, wherein at least one of said instruction enables said microprocessor to switch configuration of said test strip circuit during an assay. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46)
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Specification