Digital measuring system and method for integrated circuit chip operating parameters
First Claim
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1. An integrated circuit chip comprising:
- at least one measuring device for providing a digital value that corresponds to at least one of a plurality of physical operating parameters of said integrated chip, wherein said measuring device is contained within said integrated circuit chip; and
at least one digital communication device through which said digital value can be communicated to a plurality of other devices including said integrated circuit chip.
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Abstract
This invention relates to digitally measuring operating parameters, for example, temperature, within a semiconductor chip and making those measurements internally available to hardware, firmware, and software.
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Citations
16 Claims
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1. An integrated circuit chip comprising:
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at least one measuring device for providing a digital value that corresponds to at least one of a plurality of physical operating parameters of said integrated chip, wherein said measuring device is contained within said integrated circuit chip; and
at least one digital communication device through which said digital value can be communicated to a plurality of other devices including said integrated circuit chip. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An integrated circuit chip system comprising:
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a plurality of processing units;
a plurality of tasks;
at least one measuring device contained within said integrated chip system for providing a digital value that corresponds to at least one of a plurality of physical operating parameters of said integrated chip; and
a supervisor device for assigning said plurality of tasks to said plurality of processing units. - View Dependent Claims (13, 14)
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15. A method for monitoring at least one of a plurality of physical parameters of at least one of a plurality of integrated circuit chips, comprising:
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obtaining a value, of said at least one of a plurality of physical parameters of said at least one of a plurality of integrated circuit chips, from a measuring device included in said at least one of a plurality of integrated circuit chips; and
digitally communicating said value to a plurality of other devices including said at least one of a plurality of integrated circuit chips. - View Dependent Claims (16)
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Specification