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Method and apparatus for passively recording product quality, employment and reliability

  • US 20040148455A1
  • Filed: 10/15/2003
  • Published: 07/29/2004
  • Est. Priority Date: 10/15/2002
  • Status: Abandoned Application
First Claim
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1. A method for tracking and recording metric parameters in a product item comprising the steps of:

  • (a) positioning an Electrically Erasable Programmable Read Only Memory (EEPROM) Chip in the item;

    (b) automatically tracking and recording all parameters in the EEPROM; and

    (c) reading said parameters recorded in step (b) into a database.

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