System and method for improving TFT-array manufacturing yields
First Claim
1. A method of improving defect detection accuracy of an electrode array testing system, wherein the electrode array defines a plurality of pixels and wherein the electrode array testing system determines if a pixel is defective based on at least one thresholding parameter, comprising:
- defining a critical number of defects;
comparing a number of defects reported by the electrode array testing system (reported defects) to the critical number of defects; and
adjusting the at least one thresholding parameter if the number of reported defects is greater than the critical number of defects.
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Accused Products
Abstract
A system and method for detecting defects in TFT-array panels is provided that improves defect detection accuracy by adjusting the thresholding parameters used to classify defective pixels when the number of defects reported by a TFT-array testing system exceeds a predetermined critical number. In a preferred embodiment, the thresholding parameters are adjusted until the number of reported defects is less than or equal to the predetermined critical number. The predetermined critical number represents a threshold number for determining if the number of reported defects is abnormally high. Reducing the number of reported defects to a number equal to or less than the predetermined critical number will decrease the operation time of the TFT-array repair equipment, because of the reduced number of potential defects it will be required to handle, and will also result in the TFT-array testing system reporting a smaller number of potential defects, with the potential defects that are reported having a higher probability of being real defects. Thus, the present invention improves the defect detection accuracy of the TFT-array testing system, even when the system'"'"'s intrinsic performance is inaccurate.
6 Citations
12 Claims
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1. A method of improving defect detection accuracy of an electrode array testing system, wherein the electrode array defines a plurality of pixels and wherein the electrode array testing system determines if a pixel is defective based on at least one thresholding parameter, comprising:
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defining a critical number of defects;
comparing a number of defects reported by the electrode array testing system (reported defects) to the critical number of defects; and
adjusting the at least one thresholding parameter if the number of reported defects is greater than the critical number of defects. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A computer-readable medium storing a program for improving defect detection accuracy of an electrode array testing system, wherein the electrode array defines a plurality of pixels and wherein the electrode array testing system determines if a pixel is defective based on at least one thresholding parameter, said program comprising:
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a first code section which compares a number of defects reported by the electrode array testing system (reported defects) to a predetermined critical number of defects; and
a second code section which adjusts the at least one thresholding parameter if the number of reported defects is greater than the critical number of defects. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification