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System and method for improving TFT-array manufacturing yields

  • US 20040150408A1
  • Filed: 08/19/2003
  • Published: 08/05/2004
  • Est. Priority Date: 01/31/2003
  • Status: Active Grant
First Claim
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1. A method of improving defect detection accuracy of an electrode array testing system, wherein the electrode array defines a plurality of pixels and wherein the electrode array testing system determines if a pixel is defective based on at least one thresholding parameter, comprising:

  • defining a critical number of defects;

    comparing a number of defects reported by the electrode array testing system (reported defects) to the critical number of defects; and

    adjusting the at least one thresholding parameter if the number of reported defects is greater than the critical number of defects.

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