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Speckle pattern analysis method and system

  • US 20040152989A1
  • Filed: 01/02/2004
  • Published: 08/05/2004
  • Est. Priority Date: 01/03/2003
  • Status: Active Grant
First Claim
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1. A system for measuring speckle of a specimen, comprising:

  • a source of coherent light capable of being aimed at a specimen;

    a camera capable of obtaining a plurality of images of the specimen; and

    a processor coupled to said camera, said processor including software capable of performing speckle analysis on a plurality of images.

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