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Methods and apparatus for testing optical and electrical components

  • US 20040169520A1
  • Filed: 12/16/2003
  • Published: 09/02/2004
  • Est. Priority Date: 12/16/2002
  • Status: Abandoned Application
First Claim
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1. An apparatus for testing in an application environment, comprising:

  • a high-frequency probe; and

    a holder adapted to removably connect an optical component to the high-frequency probe and adapted to removably connect the high-frequency probe to an application substrate.

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