Methods and apparatus for testing optical and electrical components
First Claim
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1. An apparatus for testing in an application environment, comprising:
- a high-frequency probe; and
a holder adapted to removably connect an optical component to the high-frequency probe and adapted to removably connect the high-frequency probe to an application substrate.
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Abstract
A method for testing a test component connected to a high-speed electrical component includes connecting a golden optical component to a high-frequency probe, connecting the high-frequency probe to the high-speed electrical component, operating the test component in an application environment to cause a transmission of a high-speed electrical signal from the high-speed electrical component to the golden optical component, and determining if the golden optical component responds to the high-speed electrical signal.
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Citations
20 Claims
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1. An apparatus for testing in an application environment, comprising:
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a high-frequency probe; and
a holder adapted to removably connect an optical component to the high-frequency probe and adapted to removably connect the high-frequency probe to an application substrate. - View Dependent Claims (2, 3, 4, 5)
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6. A method for testing an optical component, comprising:
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connecting the optical component to a high-frequency probe;
connecting the high-frequency probe to a golden high-speed electrical component;
transmitting a high-speed electrical signal from the golden high-speed electrical component to the optical component; and
identifying a response by the optical component to the high-speed electrical signal. - View Dependent Claims (7, 8, 9, 10)
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11. A method for testing a test component connected to a high-speed electrical component, comprising:
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connecting a golden optical component to a high-frequency probe;
connecting the high-frequency probe to the high-speed electrical component;
operating the test component in an application environment to cause a transmission of a high-speed electrical signal from the high-speed electrical component to the golden optical component; and
determining if the golden optical component responds to the high-speed electrical signal. - View Dependent Claims (12, 13, 14, 15)
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16. A method for testing a test component connected to a high-speed electrical component, comprising:
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connecting a golden optical component to a high-frequency probe;
connecting the high-frequency probe to the high-speed electrical component;
transmitting a high-speed electrical signal from the golden optical component to the high-speed electrical component; and
identifying a response by the test component. - View Dependent Claims (17, 18, 19, 20)
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Specification