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Tested semiconductor device produced by an interconnection element with contact blade

  • US 20040177499A1
  • Filed: 03/31/2004
  • Published: 09/16/2004
  • Est. Priority Date: 11/10/1998
  • Status: Abandoned Application
First Claim
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1. An electrical apparatus, comprising:

  • at least one blade on an end of an interconnection element, said blade having a given length and oriented on the interconnection element such that said length runs substantially parallel to a horizontal motion of said blade relative to an electrical terminal.

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