Drop shock measurement system and acceleration sensor element used in the same

• US 20040182182A1
• Filed: 01/30/2004
• Published: 09/23/2004
• Est. Priority Date: 08/09/2001
• Status: Active Grant

• Current Assignee: Hirofumi Tajika, Kazunari Nishihara, Koji Nomura, Motoyuki Toji
• Original Assignee: Hirofumi Tajika, Kazunari Nishihara, Koji Nomura, Motoyuki Toji
• Inventors: Nomura, Koji, Tajika, Hirofumi, Toji, Motoyuki, Nishihara, Kazunari
• Granted Patent: US 7,493,818 B2
• Time in Patent Office: Days
• US Class Current: 73/865.3
• CPC Class Codes: G01N 2291/02827 Elastic parameters, strength or force
• CPC Class Codes: G01P 15/0891 with indication of predetermined acceleration values G01P15/135 takes precedence
• CPC Class Codes: G01P 15/0922 of the bending or flexing mode type
• CPC Class Codes: G01P 15/097 by vibratory elements

Abstract

The drop impact measuring system has i) a plurality of bimorph-type acceleration sensor containing a plurality of free vibrating sections each of which has individual draw-out electrodes; ii) a switch section for selecting output from the bimorph-type acceleration sensors; iii) an amplifying circuit for amplifying a signal applied via the switch section from the acceleration sensors; and iv) a logic circuit for logically evaluating the output from the amplifying circuit and controlling the switch section according to the result acquired from the logical evaluation.

Claims

1. A drop impact measuring system comprising:

a) a plurality of bimorph-type acceleration sensors containing a plurality of free vibrating sections each of which has individual draw-out electrodes;

b) a switch section for selecting output of the plurality of bimorph acceleration sensors obtained through the draw-out electrodes;

c) an amplifying circuit for amplifying at least one of voltage and current applied via the switch section from the bimorph acceleration sensors; and

d) a logic circuit for logically evaluating the output from the amplifying circuit and controlling the switch section according to result acquired from the logical evaluation.

2. A bimorph-type acceleration sensor element, which is used for a bimorph-type acceleration sensor, comprising i) a plurality of free vibrating sections having a cantilever beam structure;

and ii) draw-out electrodes for drawing out a signal generated in the free vibrating sections.

3. The bimorph-type acceleration sensor element of claim 2, wherein the plurality of the free vibrating sections are of different lengths and are electrically independent.

4. The bimorph-type acceleration sensor element of claim 2, wherein the plurality of the free vibrating sections are of identical length and are electrically connected in parallel.

5. A bimorph-type acceleration sensor element, which is used for a bimorph-type acceleration sensor, comprising i) a plurality of free vibrating sections having a both-ends-supported beam structure;

and ii) draw-out electrodes for drawing out a signal generated in the free vibrating sections.

6. The bimorph-type acceleration sensor element of claim 5, wherein the plurality of the free vibrating sections are of different lengths and are electrically independent.

7. The bimorph-type acceleration sensor element of claim 5, wherein the plurality of the free vibrating sections are of identical length and are electrically connected in parallel.