Transverse differential interferometric confocal microscopy

• US 20040201853A1
• Filed: 02/13/2004
• Published: 10/14/2004
• Est. Priority Date: 02/13/2003
• Status: Active Grant

• Current Assignee: Zetetic Institute
• Original Assignee: Zetetic Institute
• Inventors: Hill, Henry Allen
• Granted Patent: US 7,046,372 B2
• Time in Patent Office: Days
• US Class Current: 356/511
• CPC Class Codes: G01B 9/04 Measuring microscopes
• CPC Class Codes: G02B 21/0024 Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
• CPC Class Codes: G02B 21/0056 based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
• CPC Class Codes: G02B 21/04 involving mirrors

Abstract

An array of conjugated quadratures of fields is measured interferometrically by a confocal interferometer and detector system wherein each conjugated quadratures comprises a difference of conjugated quadratures of fields of beams scattered/reflected or transmitted by a pair of spots in or on a substrate. The array of conjugated quadratures is measured jointly, i.e., simultaneously, and the components of each conjugated quadratures may be measured jointly. Each pair of spots generally has a relative displacement on the order of the three or more times the size of the spots in a direction nominally tangent to the surface of the substrate. The relative phases of the beams subsequently scattered/reflected or transmitted by the pair of spots on/in a substrate may be adjusted as a set by control of a single system parameter so that the conjugated quadratures of the array of conjugated quadratures are nominally zero, i.e., information may be obtained about the substrate with the interferometer and detector system operating in a dark field mode. Operation in a dark field mode leads to both reduced systematic and statistical errors in the information and increased throughput. The information may include the transverse derivative of a profile of one or more surfaces of a substrate; one-dimensional, two-dimensional, and three-dimensional transverse differential images of a substrate; critical dimensions of features or artifacts on or in a substrate, and the size and location of sub-wavelength defects in or on a substrate.

Claims

1. A differential interferometric confocal microscope for measuring an object, said microscope comprising:

a source-side pinhole array;

a detector-side pinhole array; and

an interferometer that images the array of pinholes of the source-side pinhole array onto a first array of spots on or in the object and onto a second array of spots on or in the object, wherein the first and second arrays of spots are displaced from each other so each pinhole of the source-side pinhole array is imaged onto two corresponding different locations that are displaced from each other, said interferometer also imaging both the first and second array of spots onto the detector-side pinhole array so that each spot of the first array of spots and its corresponding spot of the second array of spots is imaged onto a corresponding pinhole of the detector-side pinhole array.

2. A differential interferometric confocal microscope for measuring an object, said microscope comprising:

a source-side pinhole array;

a detector-side pinhole array; and

an interferometer that images each pinhole of the source-side pinhole array onto a corresponding pair of two different spots on or in the object to thereby generate a first image of the source-side pinhole array and a second image of the source-side pinhole array that is displaced from the first image of the source-side pinhole array and that images both spots of each corresponding pair of spots onto a corresponding pinhole of the detector-side pinhole array.

3. The differential interferometric confocal microscope of claim 2 wherein a single pinhole array serves as both the source-side pinhole array and the detector-side pinhole array.

4. The differential interferometric confocal microscope of claim 3 wherein the interferometer comprises:

a first optical element providing a first reflecting surface;

a second optical element providing a second reflecting surface; and

a beam splitter positioned between the first and second optical elements, wherein the first optical element is located between said single pinhole array and the beam splitter and wherein the second optical element is located between the beam splitter and a location at which the object is positioned during use, wherein the first reflecting surface has a center of curvature for which there is a corresponding conjugate as viewed through the beam splitter, and wherein the second reflecting surface has a center of curvature that is displaced relative to the corresponding conjugate of the center of curvature of the first reflecting surface.

5. The differential interferometric confocal microscope of claim 4 wherein the center of curvature of the second reflecting surface is displaced relative to the corresponding conjugate of the center of curvature of the first reflective surface in a direction that is substantially parallel to a plane defined by the beam splitter.

6. The differential interferometric confocal microscope of claim 3 wherein the interferometer comprises:

a first optical element providing a first reflecting surface;

a second optical element providing a second reflecting surface; and

a beam splitter positioned between the first and second optical elements to receive an array of measurement beams from the single pinhole array, wherein the first optical element is located between the beam splitter and said single pinhole array and the second optical element is located between the beam splitter and the object and wherein the first and second reflecting surfaces along with the beam splitter cooperate to generate the first array of spots and the second array of spots.

7. The differential interferometric confocal microscope of claim 3 wherein the interferometer comprises:

a first optical element providing a first reflecting surface;

a second optical element providing a second reflecting surface; and

a beam splitter positioned between the first and second optical elements to receive an array of measurement beams from the single pinhole array and generate an array of reflected measurement beams and an array of transmitted measurement beams, wherein the first reflecting surface aids in focusing at least part of the array of reflected measurement beams onto the object via the beam splitter to produce the first array of spots and wherein the second reflecting surface aids in focusing at least a portion of the array of reflected measurement beams onto the object via the beam splitter to produce the second array of spots.

8. The differential interferometric confocal microscope of claim 7 wherein the first reflecting surface has a center of curvature for which there is a corresponding conjugate as viewed through the beam splitter, wherein the second reflecting surface has a center of curvature that is displaced relative to the corresponding conjugate of the center of curvature of the first reflecting surface.

9. The differential interferometric confocal microscope of claim 8 wherein the center of curvature of the second reflecting surface is displaced relative to the corresponding conjugate of the center of curvature of the first reflective surface in a direction that is substantially parallel to a plane defined by the beam splitter.

10. The differential interferometric confocal microscope of claim 7 wherein the first reflecting surface is substantially concentric with a point on the object.

11. The differential interferometric confocal microscope of claim 7 wherein the first array of spots produces a first array of return measurement beams and the second array of spots produces a second array of return measurement beams and wherein the first and second reflecting surfaces and the beam splitter cooperate to participate in focusing a portion of each beam of the first array of return measurement beams onto a corresponding different pinhole of said single pinhole array and to participate in focusing focus a portion of each beam of the second array of return measurement beams onto a corresponding different pinhole of said single pinhole array.

12. The differential interferometric confocal microscope of claim 11 wherein the first reflecting surface has a center of curvature for which there is a corresponding conjugate as viewed through the beam splitter, and wherein the second reflecting surface has a center of curvature that is displaced relative to the corresponding conjugate of the center of curvature of the first reflecting surface.

13. The differential interferometric confocal microscope of claim 12, wherein the second optical element provides a refracting surface positioned between the object and the beam splitter to receive light rays from the object.

14. The differential interferometric confocal microscope of claim 13, wherein the first reflecting surface substantially conforms to a sphere having a first radius and the refracting surface conforms to a sphere having a second radius, wherein the first radius is greater than the second radius.

15. The differential interferometric confocal microscope of claim 12, wherein the center of curvature of the second reflecting surface is displaced relative to the corresponding conjugate of the center of curvature of the first reflecting surface by a given distance and wherein the refracting surface has a center of curvature that is displaced from the center of curvature of the first reflecting surface by said given distance.

16. The differential interferometric confocal microscope of claim 12, wherein the first optical element provides a refracting surface positioned between the beam splitter and said single pinhole array.

17. The differential interferometric confocal microscope of claim 12 wherein the second reflecting surface is substantially concentric with an image point on said single pinhole array.

18. The differential interferometric confocal microscope of claim 16, wherein the second reflecting surface substantially conforms to a sphere having a first radius and the refracting surface conforms to a sphere having a second radius, wherein the first radius is greater than the second radius.

19. The differential interferometric confocal microscope of claim 16, wherein the center of curvature of the second reflecting surface is displaced relative to the corresponding conjugate of the center of curvature of the first reflecting surface by a given distance and wherein the refracting surface has a center of curvature that is displaced from the center of curvature of the second reflecting surface by said given distance.

20. The differential interferometric confocal microscope of claim 7, wherein said single pinhole array is a two-dimensional array.

21. The differential interferometric confocal microscope of claim 20, wherein the two-dimensional array is of equally-spaced holes.

22. The differential interferometric confocal microscope of claim 21, wherein the equally-spaced holes are circular apertures.

23. The differential interferometric confocal microscope of claim 6, wherein the interferometer is a far-field interferometer.

24. The differential interferometric confocal microscope of claim 6, wherein the interferometer is a near-field interferometer.

25. The differential interferometric confocal microscope of claim 2, wherein the source-side pinhole array generates an array of beams and the interferometer comprises an optical subsystem that includes a polarizing beam splitter, wherein the polarizing beam splitter produces from the array of beams a first array of measurement beams and a second array of measurement beams, wherein the optical subsystem focuses the first array of measurement beams onto the object to produce a first array of spots and focuses the second array of measurement beams onto the object to produce a second array of spots wherein each spot of the second array of spots is displaced from a corresponding different spot of the first array of spots by a common displacement amount, and wherein the optical subsystem images the first array of spots onto the detector-side pinhole array so that each spot of the first array of spots is imaged onto a different corresponding pinhole of the detector-side pinhole array and images the second array of spots onto the detector-side pinhole array so that each spot of the second array of spots is imaged onto a different corresponding pinhole of the detector-side pinhole array.

26. A differential interferometric confocal microscope for measuring an object, said microscope comprising:

a source for producing an input optical beam;

a pinhole beam-splitter including a pinhole arranged to receive the optical input beam and generate a first measurement beam, a second measurement beam, and a reference beam therefrom; and

an interferometer that focuses the first and second measurement beams onto a first spot on or in the object and onto a second spot on or in the object, said second spot displaced from said first spot, said interferometer further imaging both the first and second spots onto the pinhole of the pinhole beam-splitter so as to combine the reference beam and optical signals coming from both the first and second spots to produce an interference beam.

27. The differential interferometric confocal microscope of claim 26 further comprising a detector arranged to receive the interference beam.

28. A differential interferometric confocal microscope for measuring an object, said microscope comprising:

a source for producing an input optical beam;

a plate defining a pinhole and arranged to receive the input optical beam;

an interferometer that images the pinhole onto a corresponding pair of two different spots on or in the object and that images the two spots of each corresponding pair of spots back onto a the pinhole to generate an output beam; and

a detector arranged to receive the output beam.