Wafer carrying robot teaching method and teaching plate

• US 20040202362A1
• Filed: 05/24/2004
• Published: 10/14/2004
• Est. Priority Date: 04/13/2001
• Status: Abandoned Application

• Current Assignee: Kabushiki Kaisha Yaskawa Denki
• Original Assignee: Kabushiki Kaisha Yaskawa Denki
• Inventors: Ishikawa, Shinichi, Wakizako, Hitoshi
• Application Number:
  US10/474,820
• Publication Number:
  US 20040202362A1
• Time in Patent Office: Days
• US Class Current: 382/153
• CPC Class Codes: B25J 9/1692 Calibration of manipulator
• CPC Class Codes: B25J 9/1697 Vision controlled systems
• CPC Class Codes: G05B 2219/39008 Fixed camera detects reference pattern held by end effector
• CPC Class Codes: H01L 21/67265 of substrates stored in a container, a magazine, a carrier, a boat or the like
• CPC Class Codes: H01L 21/681 using optical controlling means

Abstract

A method for teaching a water carrying robot which employs a simple, inexpensive apparatus and is capable of not only maintaining a clean condition inside a front end but also effecting a saving of teaching work.

A positioning mark (3) is provided on the hand (2) of a wafer carrying robot (1) and a teaching plate (5) having a camera (6) for pickup of the positioning mark (3) is arranged at a predetermined position. The positioning mark (3) is photographed by the camera (6) and an operator corrects the position of the hand (2) so that the positioning mark (3) occupies a predetermined position in an image of the camera (6) and positions the hand (2) in a horizontal plane.

Claims

1. A method for teaching a wafer carrying robot to carry a wafer placed and held in a predetermined place out of the place or to carry a wafer in a predetermined place, comprising the steps of:

providing a positioning mark on the hand of the wafer carrying robot,

arranging a teaching plate at a predetermined place, the teaching plate having a camera for pickup of the positioning mark,

making the camera take a photograph of the positioning mark,

correcting the position of the hand by an operator'"'"'s operation so that the positioning mark occupies a predetermined position in the image picked up by the camera, and

positioning the hand in a horizontal plane.

2. A method for teaching a wafer carrying robot according to claim 1,

wherein the position of the hand in its height direction is adjusted by the operator'"'"'s operation to bring the image of the positioning mark picked up by the camera into focus, and

the positioning of the hand in its vertical direction is carried out based on the height adjusted so that the positioning mark is picked us into focus.

6. A method for teaching a wafer carrying robot according to one of claim 1 through claim 5, wherein the wafer carrying robot is taught by using the teaching plate having a transmitter for wirelessly transmitting a signal of the image photographed by the camera.

3. A method for teaching a wafer carrying robot to carry a wafer placed and held in a predetermined place out of the place or to carry a wafer in a predetermined place, comprising the steps of:

providing a positioning mark on the hand of the wafer carrying robot,

arranging a teaching plate at a predetermined place, the teaching plate having a camera for pickup of the positioning mark,

making the camera take a photograph of the positioning mark,

measuring the difference between the position of the positioning mark in the image of the positioning mark photographed by the camera and the position of the positioning mark in the image obtained when the hand is properly positioned,

automatically correcting the position of the hand using the difference measured, and

carrying out the positioning of the hand in the horizontal plane.

4. A method for teaching a wafer carrying robot according to claim 3,

wherein while the hand is being moved in the vertical direction, the differential value of shading of pixels in the image of the positioning mark photographed by the camera is obtained,

the hand is stopped in a position where the number of pixels whose differential value exceeds a predetermined threshold is maximized, and it

the positioning of the hand in its vertical direction is carried out based on the height where the hand is stopped.

5. A method for teaching a wafer carrying robot according to claim 3,

wherein the size of the image of the positioning mark photographed by the camera is obtained and compared with a predetermined size,

the hand is moved vertically so that the size of the image becomes equal to the predetermined size so as to carry out the positioning of the hand in the vertical direction.

7. A teaching plate, having:

a configuration and dimensions wherein the same positioning can be carried out with the actual wafer, and

a camera for pickup of a mark for positioning the hand of a wafer carrying robot.

8. A teaching plate according to claim 7, further having a transmitter for wirelessly transmitting a signal of the image, photographed by the camera.