Dynamic creation and modification of wafer test maps during wafer testing
First Claim
1. A method for dynamic wafer map creation, comprising:
- testing a wafer using a first test map;
acquiring one or more candidate patterns during testing;
identifying a subset of test locations within the wafer that intersect with one or more of the candidate patterns; and
dynamically creating one or more second test maps based on the one or more patterns and the subset of intersecting test locations.
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Abstract
Methods, systems, and apparatuses provide dynamic creation and modification of wafer test maps. Test plans are defined for a testing session of a wafer lot. The test plan is associated with a number of seed map patterns. During a wafer lot testing session, test results are dynamically obtained and examined at run-time of a test. Moreover, the seed map patterns are overlaid on the test sites defined in the test plan. If the test result statistics are outside of defined threshold tolerance levels, then a new wafer test map is created or modified at run-time, according to corresponding seed map patterns. If seed map patterns are within the intersection of valid test sites, then seed map patterns are created at run-time.
84 Citations
41 Claims
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1. A method for dynamic wafer map creation, comprising:
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testing a wafer using a first test map;
acquiring one or more candidate patterns during testing;
identifying a subset of test locations within the wafer that intersect with one or more of the candidate patterns; and
dynamically creating one or more second test maps based on the one or more patterns and the subset of intersecting test locations. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for dynamic wafer map creation, comprising:
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loading a wafer test plan;
testing a first test map against a wafer;
obtaining first results;
determining patterns for additional testing on the wafer by locating a number of test sites defined in the test plan that intersect a number of predefined seeded patterns associated with one or more second test maps; and
creating dynamic instances of the one or more second test maps by using the located test sites and the first results. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14)
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15. A method for dynamic wafer map creation, comprising:
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executing a first test on a wafer using a first test map;
identifying test sites on the wafer available for testing;
matching a number of the test sites with patterns associated with one or more second test maps; and
dynamically executing one or more second tests on the wafer using the one or more second test maps. - View Dependent Claims (16, 17, 18)
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19. A dynamic wafer testing system, comprising:
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a lot of wafers subject to a testing session associated with a test plan;
a first test map associated with the test plan;
a number of test sites associated with each of the wafers in the lot and identified in the test plan; and
a test station controller that initiates testing of the first test map on a first wafer in the lot, and that acquires the test sites identified in the test plan, and wherein the test station controller identifies a number of additional test maps associated with patterns of the test sites on the first wafer, and dynamically tests the first wafer and the remaining wafers using the additional test maps identified during the testing session. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26)
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27. A dynamic wafer testing system, comprising:
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a data store of patterns associated with testing maps; and
a test station controller that dynamically creates one or more of the testing maps associated with a number of the patterns that are detected on sites to be tested on a lot of wafers, and wherein the test station controller can process a number of the one or more testing maps in parallel. - View Dependent Claims (29, 30, 31, 32)
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28. The dynamic wafer testing system 27, wherein the wafer test station controller dynamically creates one or more of the testing maps based on test results associated with testing another one of the testing maps.
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33. A dynamic wafer testing system, comprising:
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a wafer that is subject to testing;
a processor instance;
a sensor instance associated with each test register included within the processor instance; and
wherein during testing of the wafer one of the sensor instances detects a measurement statistic that exceeds a predefined threshold, and based on that event a new wafer test map is identified and used to continue testing the wafer. - View Dependent Claims (34, 35, 36)
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37. A wafer subject to dynamic testing from instructions accessible to a computer-readable medium, where the instructions comprise:
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identifying a test plan associated with testing the wafer;
identifying test sites on the wafer from the test plan;
initiating a first test map created from the test plan to begin testing of the wafer; and
dynamically creating one or more second test maps for further testing of the wafer during a testing session. - View Dependent Claims (38, 39, 40, 41)
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Specification