IC socket

• US 20040212383A1
• Filed: 04/19/2004
• Published: 10/28/2004
• Est. Priority Date: 04/25/2003
• Status: Active Grant

• Current Assignee: Yokowo Company Limited
• Original Assignee: Yokowo Company Limited
• Inventors: Suzuki, Mitsuhiro, Sato, Atsushi, Yanagisawa, Wasuke, Yoshida, Takuto
• Granted Patent: US 6,953,348 B2
• Time in Patent Office: Days
• US Class Current: 324/755
• CPC Class Codes: G01R 1/0441 Details
• CPC Class Codes: G01R 1/045 Sockets or component fixtures for RF or HF testing
• CPC Class Codes: G01R 1/06772 High frequency probes

Abstract

An IC socket receives an IC provided with arrayed terminals. In the IC socket, a conductive block is formed with a first face opposing to the received IC, and a plurality of holes arrayed in association with the terminals of the received IC. Each of a plurality of contact probes is disposed in each of the holes, and is provided with a conductive pipe, and a conductive plunger, retractably provided at a first end of the pipe, the plunger being to be brought into contact with an associated one of the terminals. A retainer provided with an insulative member through which the pipe is coaxially held within an associated one of the holes while forming a gap between an outer periphery of the pipe and an interior wall of the associated one of the holes. At least one of the contact probes to be brought into contact with an RF signal terminal among the terminals of the received IC is retained by the retainer.

Claims

1. An IC socket, for receiving an IC provided with arrayed terminals, the IC socket comprising:

a conductive block, formed with a first face opposing to the received IC, and a plurality of holes arrayed in association with the terminals of the received IC;

a plurality of contact probes, each of which is disposed in each of the holes, and comprises;

a conductive pipe; and

a conductive plunger, retractably provided at a first end of the pipe, the plunger being to be brought into contact with an associated one of the terminals; and

a retainer, comprising an insulative member through which the pipe is coaxially held within an associated one of the holes while forming a gap between an outer periphery of the pipe and an interior wall of the associated one of the holes,

wherein at least one of the contact probes to be brought into contact with an RF signal terminal among the terminals of the received IC is retained by the retainer.

2. The IC socket as set forth in claim 1, wherein at least one of the contact probes is brought into contact with an earth terminal among the terminals of the received IC.

3. The IC socket as set forth in claim 1, further comprising a conductive rubber layer, disposed between the first face of the block and an earth terminal among the terminals of the received IC.

4. The IC socket as set forth in claim 1, wherein:

the contact probes includes a first contact probe which is brought into contact with either a non-RF signal terminal or a power supply terminal among the terminals of the received IC, and a second contact probe which is to be brought into contact with the RF signal terminal; and

a ratio of an inner diameter of a first hole in which the first contact probe is disposed to an outer diameter of the first contact probe is smaller than a ration of an inner diameter of a second hole in which the second contact probe is disposed to an outer diameter of the second contact probe.