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Method and structure to develop a test program for semiconductor integrated circuits

  • US 20040225459A1
  • Filed: 02/06/2004
  • Published: 11/11/2004
  • Est. Priority Date: 02/14/2003
  • Status: Abandoned Application
First Claim
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1. A method for developing a test program in general purpose C/C++ constructs, the test program for testing a semiconductor integrated circuit (IC) in a semiconductor test system, the method comprising:

  • describing test system resources, test system configuration, and module configuration in general-purpose C/C++ constructs for the development of a test program to test the IC on the semiconductor test system;

    describing a test sequence in general-purpose C/C++ constructs for the development of the test program to test the IC on the semiconductor test system;

    describing a test plan in general-purpose C/C++ constructs for the development of the test program to test the IC on the semiconductor test system;

    describing test conditions in general-purpose C/C++ constructs for the development of the test program to test the IC on the semiconductor test system;

    describing test patterns in general-purpose C/C++ constructs for the development of the test program to test the IC on the semiconductor test system; and

    describing timing of the test patterns in general-purpose C/C++ constructs for the development of the test program to test the IC on the semiconductor test system.

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