System and method for examining mask pattern fidelity
First Claim
1. A mask fidelity inspection method comprising:
- generating a mask picture from a first mask, the first mask being made from a predetermined mask design with a first OPC model applied thereto;
converting the mask picture into a simulation required mask file;
conducting a first simulation under a first set of predetermined photolithography processing conditions using the simulation required mask file to generate one or more files of a first set representing a first wafer photo resist profile thereof;
applying the first OPC model to the predetermined mask design in a database mask file format;
conducting a second simulation under the first set of predetermined photolithography processing conditions using the OPCed mask design to generate one or more files of a second set representing a second wafer photo resist profile thereof; and
comparing the first and second sets of files.
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Accused Products
Abstract
A method and system is disclosed for examining mask pattern fidelity. First, a mask picture is generated from a first mask with a first OPC model applied to a mask design thereon. The mask picture is then converted into a mask based simulation file. A first simulation is conducted under a first set of predetermined lithography processing conditions using the converted simulation file to generate one or more files of a first set representing wafer photo resist profile thereof. On the other hand, a mask design in a database mask file is identified which was used for generating the first mask. The first OPC model is applied to the mask design in the database mask file. A second simulation is then conducted under the first set of predetermined lithography processing conditions using the OPCed mask design to generate one or more files of a second set representing wafer photo resist profile thereof. The first and second sets of files are then evaluated together for the purpose of inspecting mask fidelity.
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Citations
22 Claims
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1. A mask fidelity inspection method comprising:
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generating a mask picture from a first mask, the first mask being made from a predetermined mask design with a first OPC model applied thereto;
converting the mask picture into a simulation required mask file;
conducting a first simulation under a first set of predetermined photolithography processing conditions using the simulation required mask file to generate one or more files of a first set representing a first wafer photo resist profile thereof;
applying the first OPC model to the predetermined mask design in a database mask file format;
conducting a second simulation under the first set of predetermined photolithography processing conditions using the OPCed mask design to generate one or more files of a second set representing a second wafer photo resist profile thereof; and
comparing the first and second sets of files. - View Dependent Claims (2, 3, 4, 5)
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6. A system for mask fidelity inspection comprising:
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an image capturing tool for generating a mask picture from a first mask with a first OPC model applied to a mask design thereon;
a database for providing a database mask file used for generating the first mask;
a first processing tool for converting the mask picture into a simulation required mask file;
a second processing tool for applying the first OPC model to a mask design represented by the database mask file;
a simulation tool for conducting a first simulation under a first set of predetermined lithography processing conditions using the converted mask file to generate one or more files of a first set representing a wafer photo resist profile thereof and conducting a second simulation under the first set of predetermined lithography processing conditions using the OPCed mask design to generate one or more files of a second set representing a wafer photo resist profile thereof; and
a comparison tool for comparing the first and second sets of files. - View Dependent Claims (7, 8, 9, 10, 11)
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12. A mask fidelity inspection method comprising:
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generating a mask picture from a first mask, the first mask being made from a predetermined mask design with a first OPC model applied thereto;
generating a second mask picture from a second mask, the second mask being made from the predetermined mask design with a second OPC model applied thereto;
converting the first and second mask pictures into a first and second mask based simulation files;
conducting a first simulation session under predetermined photolithography processing conditions using the first mask based simulation file to generate one or more files representing a first wafer photo resist profile thereof;
conducting a second simulation session under the predetermined photolithography processing conditions using the second mask based simulation file to generate one or more files representing a second wafer photo resist profile thereof; and
applying the first and second OPC models to the predetermined mask design in a database mask file format;
conducting a third simulation under the predetermined photolithography processing conditions using the mask design with the third OPC model to generate one or more files of a third set representing an expected wafer photo resist profile thereof;
conducting a fourth simulation under the predetermined photolithography processing conditions using the mask design with the second OPC model to generate one or more files of a fourth set representing an expected wafer photo resist profile thereof; and
evaluating the first, second, third and fourth wafer photo resist profiles. - View Dependent Claims (13, 14, 15, 16, 17)
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18. A mask fidelity inspection method comprising:
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generating a mask picture from a first mask, the first mask being made from a predetermined mask design with a predetermined OPC model applied thereto under a first mask making process;
generating a second mask picture from a second mask, the second mask being made from the predetermined mask design with the predetermined OPC model applied thereto but under a second mask making process;
converting the first and second mask pictures into a first and second mask based simulation files respectively;
conducting a first simulation session under predetermined photolithography processing conditions using the first mask based simulation file to generate one or more files representing a first wafer photo resist profile thereof;
conducting a second simulation session under the predetermined photolithography processing conditions using the second mask based simulation file to generate one or more files representing a second wafer photo resist profile thereof; and
applying the OPC model to the predetermined mask design in a database mask file format;
conducting a third simulation under the predetermined photolithography processing conditions using the OPCed mask design to generate one or more files of a third set representing an expected wafer photo resist profile thereof; and
evaluating the first and second wafer photo resist profiles with the expected wafer photo resist profile to determine a preferred mask making process for the predetermined OPC model. - View Dependent Claims (19, 20, 21, 22)
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Specification