Systems and methods for controlling an X-ray source

• US 20040247080A1
• Filed: 03/04/2004
• Published: 12/09/2004
• Est. Priority Date: 03/04/2003
• Status: Active Grant

• Current Assignee: X-Ray Optical Systems Incorporated (Veralto Corp.)
• Original Assignee: Inpho, Inc.
• Inventors: Feda, Francis Michael
• Granted Patent: US 7,233,645 B2
• Time in Patent Office: Days
• US Class Current: 378/101
• CPC Class Codes: G01N 2223/076 X-ray fluorescence
• CPC Class Codes: G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• CPC Class Codes: H05G 1/30 Controlling
• CPC Class Codes: H05G 1/44 in which the switching instant is determined by measuring the amount of radiation directly dosimetry in general G01T1/02
• CPC Class Codes: H05G 1/46 Combined control of different quantities, e.g. exposure time as well as voltage or current

Abstract

A control system for an X-ray source includes a sensor interface for receiving one or more sensor signals representative of operation of the X-ray source; a programmable controller operative in response to the one or more sensor signals and a sequence of control instructions for generating one or more control signals for controlling the X-ray source; and a control interface for supplying the one or more control signals to the X-ray source, either directly or indirectly.

Claims

1. A control system for an X-ray source, comprising:

a sensor interface for receiving one or more sensor signals representative of operation of the X-ray source;

a programmable controller operative in response to the one or more sensor signals and a sequence of control instructions for generating one or more control signals for controlling the X-ray source; and

a control interface for supplying the one or more control signals to the X-ray source, either directly or indirectly.

2. A control system as defined in claim 1, wherein the programmable controller is selected from a group consisting of a microcontroller, a microprocessor and a digital signal processor.

3. A control system as defined in claim 1, wherein the sensor interface comprises a feedback interface configured to receive one or more feedback signals for operation of a feedback control loop.

4. A control system as defined in claim 1, wherein the sensor interface is configured to receive one or more signals from a detector sensitive to an X-ray source output property.

5. A control system as defined in claim 1, wherein the sensor interface is configured to receive one or more signals from a detector sensitive to an effect produced by X-ray irradiation from the X-ray source.

6. A control system as defined in claim 1, further comprising a power supply for operating the X-ray source.

7. A control system as defined in claim 6, wherein the sensor interface is configured to receive one or more signals representative of power supply operation.

8. A control system as defined in claim 6, further comprising a battery for operation of the control system and a housing of suitable size, shape and weight for handheld applications.

9. A control system as defined in claim 1, wherein the programmable controller is programmed to perform feedback control of an X-ray source property in response to a reference input and a feedback signal.

10. A control system as defined in claim 1, wherein the programmable controller is programmed to establish a parameter value associated with the X-ray source without performing feedback control of the X-ray source parameter.

11. A control system as defined in claim 1, wherein the programmable controller is programmed to monitor a feedback control loop associated with control of the X-ray source.

12. A control system as defined in claim 1, wherein the programmable controller is programmed to modulate an X-ray output of the X-ray source.

13. A control system as defined in claim 1, wherein the programmable controller is programmed to modulate an X-ray output of the X-ray source in synchronism with a sensor signal representative of an external event.

14. A control system as defined in claim 1, wherein the sensor interface is configured to receive a position sensor signal representative of electron beam position in the X-ray source and wherein the programmable controller is programmed to adjust the electron beam position in response to the position sensor signal.

15. A control system as defined in claim 1, wherein the sensor interface is configured to receive a position sensor signal representative of electron beam position in the X-ray source and wherein the programmable controller is programmed to determine electron beam position in response to the position sensor signal.

16. A control system as defined in claim 1, wherein the programmable controller is programmed for communication with one or more other control systems.

17. A control system as defined in claim 1, wherein the programmable controller is programmed for communication with a host computer.

18. A control system as defined in claim 1, wherein the programmable controller is configured for connection in a network of X-ray modules controlled by one of the X-ray modules.

19. A control system as defined in claim 1, wherein the programmable controller is programmed for connection in a network of X-ray modules controlled by a host computer.

20. A method for controlling an X-ray source, comprising:

receiving one or more sensor signals representative of operation of the X-ray source;

using a programmable controller for generating one or more control signals for controlling the X-ray source in response to the one or more sensor signals and a sequence of control instructions; and

supplying the one or more control signals to the X-ray source, either directly or indirectly.

21. A control system for an X-ray source, comprising:

a position sensor configured to sense a position of an X-ray output of the X-ray source and for generating a position signal in response to the sensed position; and

a controller operative in response to the position signal to generate one or more control signals for adjusting the position of the X-ray output.

22. A control system as defined in claim 21, wherein the control signals are supplied to deflection coils associated with the X-ray source for deflecting an electron beam in the X-ray source.

23. A control system for an X-ray source, comprising:

a detector interface for receiving one or more detector signals representative of a characteristic of an X-ray output of the X-ray source;

a controller operative in response to the one or more detector signals to generate one or more control signals for controlling the X-ray source; and

a control interface for supplying the one or more control signals to the X-ray source, either directly or indirectly.

24. A control system for an X-ray source, comprising:

a detector interface for receiving one or more detector signals representative of an effect produced by an X-ray output of the X-ray source;

a controller operative in response to one or more detector signals to generate one or more control signals for controlling the X-ray source; and

a control interface for supplying the one or more control signals to the X-ray source, either directly or indirectly.

25. A control system as defined in claim 24, further comprising a detector configured to measure an effect produced by the X-ray output of the X-ray source and to produce a detector signal.