Image processing method for appearance inspection

• US 20040247171A1
• Filed: 03/12/2004
• Published: 12/09/2004
• Est. Priority Date: 07/26/2002
• Status: Abandoned Application

• Current Assignee: Panasonic Electric Works Company Limited (Panasonic Holdings Corporation)
• Original Assignee: Panasonic Electric Works Company Limited (Panasonic Holdings Corporation)
• Inventors: Ikeda, Kazutaka, Hashimoto, Yoshihito
• Application Number:
  US10/489,417
• Publication Number:
  US 20040247171A1
• Time in Patent Office: Days
• US Class Current: 382/141
• CPC Class Codes: G06T 7/001 using an image reference approach
• CPC Class Codes: G06V 10/754 involving a deformation of the sample pattern or of the reference pattern; Elastic matching

Abstract

A method for appearance inspection utilizes a reference image and an object image. Before determining a final reference image for direct comparison with the object image, the outlines of the reference and object images are extracted and processed in accordance with an error function indicative of linear or quadric deformation of the object image in order to derive error parameters including a position, a rotation angle, and a scale of the object image relative to reference image. The resulting error parameters are applied to transform the reference outline. The step of updating the error parameters and transforming the reference outline is repeated until the updated error parameters satisfy a predetermined criterion with respect to a linear or quadric transformation factor of the object image. Thereafter, the last updated parameters are applied to transform the reference image into the final reference image for direct comparison with the object image.

Claims

1. An image processing method for appearance inspection, said method comprising the steps of:

a) taking a picture of an object to be inspected to provide an object image for comparison with a reference image;

b) extracting an outline of said object image to give an object outline;

c) extracting an outline of said reference image to give a reference outline;

d) processing data of said object outline and said reference outline in accordance with a least-square error function for deriving error parameters including a position, a rotation angle, and a scale of the object outline relative to said reference outline, and applying the resulting error parameters to transform said reference outline;

e) repeating the step of (d) until said resulting error parameters satisfy a predetermined criterion indicative of a linear transformation factor of said object image;

f) applying said error parameters to transform said reference image into a final reference image;

g) comparing said object image with the final reference image to select pixels of said object image each having a grey-scale intensity far from a corresponding pixel of said final reference image by a predetermined value or more, and

h) analyzing thus selected pixels to judge whether the object image is different from the reference image, and providing a defect signal if the object image is different from the reference image.

3. The method as set forth in claim 1 or 2, wherein

said reference image is obtained through the steps of

using a standard reference image indicating an original object,

examining said picture to determine a frame in which said object appears in rough coincidence with said standard reference image;

comparing the object in said frame with said standard reference image to obtain preliminary error parameters including the position, the rotating angle and the scale of the object in the frame relative to said original reference image,

applying said preliminary error parameters to transform said standard reference image into said reference image.

4. The method as set forth in claim 1 or 2, wherein

each of said object outline and said reference outline is obtained by using the Sobel filter to trace an edge that follows the pixels having local maximum intensity and having a direction θ

of −

45°

to +45°

, wherein said direction (θ

) is expressed by a formula

θ

=tan<sup>−

1</sup>(R/S), where R is a first derivative of the pixel in x-direction and S is a second derivative of the pixel in y-direction of the image.

5. The method as set forth in claim 1 or 2, wherein

each of said object outline and said reference outline is obtained by the steps of:

smoothing each of said object image and said reference image to different degrees in order to give a first smoothed image and a second smoothed image;

differentiating the first and second smoothed images to give an array of pixels of different numerical signs,

picking up the pixels each being indicated by one of numerical signs and at the same time being adjacent to at least one pixel of the other numerical sign, and tracing thus picked up pixels to define the outline.

6. The method as set forth in claim 1 or 2, further comprising steps of:

smoothing the picture to different degrees to provide a first picture and a second picture,

differentiating the first and second picture to give an array of pixels of different numerical signs, and

picking up the pixels of the same signs to provide an inspection zone only defined by thus picked-up pixels,

said object image being compared with said final reference image only at said inspection zone to select pixels within the inspection zone each having a grey-scale intensity far from a corresponding pixel of said final reference image by the predetermined value or more.

7. The method as set forth in claim 1 or 2, wherein

the step (h) of analyzing the pixels comprises the sub-steps of

defining a coupling area in which the selected pixels are arranged in an adjacent relation to each other,

calculating a pixel intensity distribution within said coupling area,

examining geometry of said coupling area,

classifying the coupling area as one of predetermined kinds of defects according to the pixel intensity distribution and the geometry of said coupling area, and outputting the resulting kind of the defect.

2. An image processing method for appearance inspection, said method comprising the steps of:

a) taking a picture of an object to be inspected to provide an object image for comparison with a reference image;

b) extracting an outline of said object image to give an object outline;

c) extracting an outline of said reference image to give a reference outline;

d) processing data of said object outline and said reference outline in accordance with a least-square error function for deriving error parameters including a position, a rotation angle, and a scale of the object outline relative to said reference outline, and applying the resulting error parameters to transform said reference outline;

e) repeating the step of (d) until said resulting error parameters satisfies a predetermined criterion indicative of a quadric transformation factor of said object image;

f) applying said error parameters to transform said reference image into a final reference image;

g) comparing said object image with the final reference image to select pixels of said object image each having a grey-scale intensity far from a corresponding pixel of said final reference image by a predetermined value or more, and

h) analyzing thus selected pixels to judge whether the object image is different from the reference image, and providing a defect signal if the object image is different from the reference image.