Selective metal encapsulation schemes
First Claim
1. A method of processing a semiconductor substrate, comprising the steps of:
- depositing a protective layer on a substrate surface comprising a conductive element;
selectively removing a portion of the protective layer to expose the conductive element of the substrate surface;
depositing a metallic passivating layer onto the exposed conductive element; and
removing at least a portion of the protective layer from the substrate after deposition of the metallic passivating.
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Accused Products
Abstract
A method and system of processing a semiconductor substrate includes, in one or more embodiments, depositing a protective layer on the substrate surface comprising a conductive element disposed in a dielectric material; processing the protective layer to expose the conductive element; electrolessly depositing a metallic passivating layer onto the conductive element; and removing at least a portion of the protective layer from the substrate after electroless deposition. In another aspect, a method and system of processing a semiconductor includes depositing a metallic passivating layer onto a substrate surface comprising a conductive element, masking the passivating layer to protect the underlying conductive element of the substrate surface, removing the unmasked passivating layer, and removing the mask from the passivating layer.
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Citations
42 Claims
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1. A method of processing a semiconductor substrate, comprising the steps of:
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depositing a protective layer on a substrate surface comprising a conductive element;
selectively removing a portion of the protective layer to expose the conductive element of the substrate surface;
depositing a metallic passivating layer onto the exposed conductive element; and
removing at least a portion of the protective layer from the substrate after deposition of the metallic passivating. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. A method of processing a semiconductor substrate, comprising:
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steps for depositing a protective layer on the substrate surface comprising a conductive element disposed in a dielectric material;
steps for processing the protective layer to expose the conductive element;
steps for depositing a metallic passivating layer onto the conductive element; and
steps for removing at least a portion of the protective layer from the substrate after electroless deposition. - View Dependent Claims (25, 26, 27, 28, 29)
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30. A system for processing a semiconductor substrate, comprising:
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means for depositing a protective layer on the substrate surface comprising a conductive element disposed in a dielectric material;
means for processing the protective layer to expose the conductive element;
means for electrolessly depositing a metallic passivating layer onto the conductive element; and
means for removing at least a portion of the protective layer from the substrate after electroless deposition. - View Dependent Claims (31, 32, 33, 34, 35)
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36. A method of processing a semiconductor substrate, comprising the steps of:
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depositing a metallic passivating layer onto a substrate surface comprising a conductive element;
masking the passivating layer to protect the underlying conductive element of the substrate surface;
removing the unmasked passivating layer; and
removing the mask from the passivating layer. - View Dependent Claims (37, 38, 39, 40, 41, 42)
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Specification