Dual-sensitivity eddy current test probe

• US 20040257072A1
• Filed: 06/19/2003
• Published: 12/23/2004
• Est. Priority Date: 06/19/2003
• Status: Abandoned Application

• Current Assignee: Zetec Incorporated (Roper Technologies, Inc.)
• Original Assignee: Zetec Incorporated (Roper Technologies, Inc.)
• Inventors: Samson, Rock
• Application Number:
  US10/464,953
• Publication Number:
  US 20040257072A1
• Time in Patent Office: Days
• US Class Current: 324/242
• CPC Class Codes: G01N 27/902 by moving the sensors
• CPC Class Codes: H01F 2003/005 Magnetic cores for receiving several windings with perpendicular axes, e.g. for antennae or inductive power transfer

Abstract

The present invention relates to a dual sensitivity eddy current test probe for inspecting a tubular member made of electrically conducting material in order to detect and localize defects in the tubular member, comprising a probe body for movement about a surface of the tubular member, a first test coil assembly for detecting and localizing defects within the tubular member, a first support for the first test coil assembly, a second test coil assembly for acquiring historical data about defects in the tubular member, a second support for the second test coil assembly, and a magnetic coupling interference eliminating system interposed between the first and second test coil assemblies. The first support is mounted on the probe body for holding the first test coil assembly at a first predetermined distance from the surface of the tubular member while the probe body moves about this surface of the tubular member. In the same manner, the second support is mounted on the probe body for holding the second test coil assembly at a second predetermined distance from the surface of the tubular member while the probe body moves about that surface of the tubular member.

Claims

1. A dual sensitivity eddy current test probe for inspecting a tubular member to detect and localize defects in the tubular member, the tubular member being composed of an electrically conducting material, comprising:

a probe body moving about a surface of the tubular member;

a first test coil assembly detecting and localizing defects within the tubular member;

a first support arrangement supporting the first test coil assembly, the first support arrangement being mounted on the probe body and holding the first test coil assembly at a first predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member;

a second test coil assembly acquiring historical data regarding defects in the tubular member;

a second support arrangement supporting the second test coil assembly, the second support arrangement being mounted on the probe body and holding the second test coil assembly at a second predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member; and

an arrangement eliminating a magnetic coupling interference between the first and second test coil assemblies.

2. A dual sensitivity eddy current test probe for inspecting a tubular member to detect and localize defects in the tubular member, the tubular member being composed of an electrically conducting material, comprising:

a probe body moving about a surface of the tubular member;

a first test coil assembly detecting and localizing defects within the tubular member;

a first support arrangement supporting the first test coil assembly, the first support arrangement being mounted on the probe body and holding the first test coil assembly at a first predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member;

a second test coil assembly acquiring historical data regarding defects in the tubular member;

a second support arrangement supporting the second test coil assembly, the second support arrangement being mounted on the probe body and holding the second test coil assembly at a second predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member; and

a magnetic coupling interference eliminating arrangement being interposed between the first and second test coil assemblies.

3. A dual sensitivity eddy current test probe as defined in claim 2, wherein the first test coil assembly includes three substantially coplanar pancake-type coils disposed in an L-shaped manner.

4. A dual sensitivity eddy current test probe as defined in claim 2, wherein the second test coil assembly includes an orthogonal coil.

5. A dual sensitivity eddy current test probe as defined in claim 2, wherein the first test coil assembly includes three substantially coplanar pancake-type coils disposed in an L-shaped manner, the second test coil assembly including an orthogonal coil, and wherein the dual sensitivity eddy current test probe further comprises:

a third low frequency test coil assembly including a pancake-type coil; and

a third support arrangement supporting the third test coil assembly, the third support arrangement being mounted on the probe body and holding the third test coil assembly at a third predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member.

6. A dual sensitivity eddy current test probe as defined in claim 2, further comprising:

a third low frequency test coil assembly; and

a third support arrangement supporting the third test coil assembly, the third support arrangement being mounted on the probe body and holding the third test coil assembly at a third predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member.

7. A dual sensitivity eddy current test probe as defined in claim 3, further comprising:

a second arrangement operating the three substantially coplanar pancake-type coils in a transmit-receive mode.

8. A dual sensitivity eddy current test probe as defined in claim 4, further comprising:

a third arrangement operating the orthogonal coil in an impedance mode.

9. A dual sensitivity eddy current test probe as defined in claim 2, wherein the magnetic coupling interference eliminating arrangement includes:

a first signal source connected to the first test coil assembly and supplying the first test coil assembly with a first signal at a first frequency, and

a second signal source connected to the second test coil assembly and supplying the second test coil assembly with a second signal at a second frequency sufficiently remote from the first frequency to prevent magnetic coupling interference between the first and second test coil assemblies.

10. A dual sensitivity eddy current test probe as defined in claim 9, wherein each of the first and second signal sources includes a frequency varying arrangement varying the first and second frequencies of the first and second signals supplied to the first and second test coil assemblies.

11. A dual sensitivity eddy current test probe as defined in claim 2, wherein the magnetic coupling interference eliminating arrangement includes a signal source system which includes a first arrangement supplying a first signal to the first test coil assembly during a first time slot and a second arrangement supplying a second signal to the second test coil during a second time slot.

12. A dual sensitivity eddy current test probe as defined in claim 2, wherein the magnetic coupling interference eliminating arrangement includes:

a first signal source connected to the first and second test coil assemblies and supplying a first signal to the first and second test coil assemblies during a first time slot; and

a second signal source connected to the first test coil assembly and supplying a second signal to the first test coil assembly only during a second time slot to prevent magnetic coupling interference during the second time slot.

13. A method for eliminating a magnetic coupling interference in a dual sensitivity eddy current test probe and inspecting a tubular member to detect and localize defects in the tubular member, the tubular member being composed of an electrically conducting material, the method comprising the steps of:

supplying a first test coil assembly of the test probe with a first signal at a first frequency; and

supplying a second test coil assembly of the test probe with a second signal at a second frequency sufficiently remote from the first frequency to prevent magnetic coupling interference between the first and second test coil assemblies,

wherein the test probe further includes a probe body moving about a surface of the tubular member, a first support arrangement supporting the first test coil assembly and a second support arrangement supporting the second test coil assembly, the first test coil assembly being utilized for detecting and localizing defects within the tubular member, the second test coil assembly being utilized for acquiring historical data regarding defects in the tubular member, the first support arrangement being mounted on the probe body and holding the first test coil assembly at a first predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member, the second support arrangement being mounted on the probe body and holding the second test coil assembly at a second predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member.

14. A method for eliminating magnetic coupling interference as defined in claim 13, further comprising:

varying the first and second frequencies of the signals supplied to the first and second test coil assemblies.

15. A method for eliminating a magnetic coupling interference in a dual sensitivity eddy current test probe and inspecting a tubular member to detect and localize defects in the tubular member, the tubular member being composed of an electrically conducting material, comprising the steps of:

supplying a first signal to a first test coil assembly of the test probe during a first time slot; and

supplying a second signal to a second test coil of the test probe during a second time slot,

wherein the test probe further includes a probe body moving about a surface of the tubular member, a first support arrangement and a second support arrangement, the first test coil assembly detecting and localizing defects within the tubular member, the first support being mounted on the probe body and supporting the first test coil assembly at a first predetermined distance from the surface of the tubular member while the probe body moves regarding the surface of the tubular member, the second test coil assembly being utilized for acquiring historical data about defects in the tubular member, the second support being mounted on the probe body and supporting the second test coil assembly at a second predetermined distance from the surface of the tubular member while the probe body moves about the surface of the tubular member.