Single event hardening of null convention logic circuits

• US 20040257108A1
• Filed: 06/17/2003
• Published: 12/23/2004
• Est. Priority Date: 06/17/2003
• Status: Active Grant

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Erstad, David O., Carlson, Roy M.
• Granted Patent: US 6,937,053 B2
• Time in Patent Office: Days
• US Class Current: 326/14
• CPC Class Codes: H03K 19/00338 In field effect transistor circuits

Abstract

A system and method for hardening a Null Convention Logic (NCL) circuit against Single Event Upset (SEU) is presented. Placing a resistive element into a feedback loop of the NCL circuit may harden the NCL circuit. A bypass element may be placed in parallel with the resistive element to increase the latching speed of the hardened NCL circuit. Additionally, replacing transistors in an input driver, the feedback loop, and an inverter with transistor stacks, which may include two or more transistors connected in series, may harden the NCL circuit. Further, two NCL gates may be cross-coupled to harden the NCL circuit.

Claims

1. A system for hardening an asynchronous logic circuit against single event upset, comprising in combination:

an asynchronous logic circuit including a feedback loop; and

a resistive element placed in the feedback loop operable to create a time constant,

wherein the time constant slows feedback response of the feedback loop, thereby allowing transient disturbances to subside prior to being latched by the asynchronous logic circuit.

2. The system of claim 1, wherein the asynchronous logic circuit is a null convention logic circuit.

3. The system of claim 1, wherein the resistive element is a circuit device selected from the group consisting of resistors, diodes, and transistors.

4. The system of claim 1, further comprising a bypass element operable to short the resistive element when an input to the asynchronous logic circuit causes an output of the asynchronous logic circuit to transition from one logic level to another logic level.

5. The system of claim 4, wherein the bypass element decreases time needed to latch a signal into the asynchronous logic circuit.

6. A method for hardening an asynchronous logic circuit against single event upset, comprising connecting a resistive element in a feedback loop of the asynchronous logic circuit, wherein the resistive element creates a time constant operable to slow feedback response of the feedback circuit, thereby allowing transient disturbances to subside prior to being latched by the asynchronous logic circuit.

7. The method of claim 6, wherein the asynchronous logic circuit is a null convention logic circuit.

8. The method of claim 6, wherein the resistive element is a circuit device selected from the group consisting of resistors, diodes, and transistors.

9. The method of claim 6, further comprising connecting a bypass element in parallel to the resistive element, wherein the bypass element is operable to short the resistive element when an input to the asynchronous logic circuit causes an output of the asynchronous logic circuit to transition from one logic level to another logic level.

10. The method of claim 9, wherein the bypass element decreases time needed to latch a signal into the asynchronous logic circuit.

11. A system for hardening an asynchronous logic circuit against single event upset, comprising in combination:

an input driver for receiving inputs to the asynchronous logic circuit;

a feedback loop;

an inverter located within the feedback loop; and

at least one transistor stack located in at least one of the input driver, the feedback loop, and the inverter, wherein the at least one transistor stack is operable to prevent energetic particles from turning on all transistors in the at least one transistor stack, thereby hardening the asynchronous logic circuit from single event upset.

12. The system of claim 11, wherein the asynchronous logic circuit is a null convention logic circuit.

13. The system of claim 11, wherein the at least one transistor stack includes at least two transistors connected in series.

14. The system of claim 13, wherein a body terminal of each series transistor is connected to a transistor source.

15. A method for hardening an asynchronous logic circuit against single event upset, comprising placing at least one transistor stack in at least one of an input driver, a feedback loop, and an inverter in the asynchronous logic circuit, wherein the at least one transistor stack is operable to prevent energetic particles from turning on all transistors in the at least one transistor stack.

16. The method of claim 15, wherein the asynchronous logic circuit is a null convention logic circuit.

17. The method of claim 15, wherein the at least one transistor stack includes at least two transistors connected in series.

18. The method of claim 17, wherein a body terminal of each series transistor is connected to a transistor source.

19. A system for hardening an asynchronous logic circuit against single event upset, comprising in combination:

a first asynchronous logic gate; and

a second asynchronous logic gate, wherein an output of the first asynchronous logic gate is connected to an input of a feedback loop in the second asynchronous logic gate and an output of the second asynchronous logic gate is connected to an input of a feedback loop in the first asynchronous logic gate, wherein the asynchronous circuit is operable to reset itself to a correct state after entering an error state.

20. The system of claim 19, wherein the asynchronous logic circuit is a null convention logic circuit.

21. The system of claim 19, wherein the output of the first asynchronous logic gate is connected to the second asynchronous logic gate through an inverter and a transistor.

22. The system of claim 19, wherein the output of the second asynchronous logic gate is connected to the first asynchronous logic gate through an inverter and a transistor.

23. The system of claim 19, wherein the single event upset causes the asynchronous logic circuit to enter the error state.

28. The method of claim 22, wherein the single event upset causes the asynchronous logic circuit to enter the error state.

24. A method for hardening an asynchronous logic circuit against single event upset, comprising in combination:

connecting an output of a first asynchronous logic gate to an input of a feedback loop in a second asynchronous logic gate; and

connecting an output of the second asynchronous logic gate to an input of a feedback loop in the first asynchronous logic gate, wherein if the output of the first asynchronous logic gate and the output of the second asynchronous logic gate are at a level representing DATA then the asynchronous logic circuit enters an error state, wherein the asynchronous logic circuit resets itself to a correct state after entering the error state.

25. The method of claim 24, wherein the asynchronous logic circuit is a null convention logic circuit.

26. The method of claim 24, wherein the output of the first asynchronous logic gate is connected to the second asynchronous logic gate through an inverter and a transistor.

27. The method of claim 24, wherein the output of the second asynchronous logic gate is connected to the first asynchronous logic gate through an inverter and a transistor.