In-situ analysis method for atomic layer deposition process
First Claim
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1. An in-situ analysis method of an atomic layer deposition (ALD) process, the method comprising:
- transferring a substrate to a reaction chamber in a vacuum container and depositing an atomic layer on the upper surface of the substrate; and
analyzing the state of the atomic layer to determine the quality of the atomic layer in real time.
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Abstract
Provided is an in-situ analysis method for an atomic layer deposition (ALD) process. The provided method includes transferring a substrate to a reaction chamber in a vacuum container, depositing an atomic layer on the upper surface of the substrate, and analyzing the state of the atomic layer to determine the quality of the atomic layer in real time. Using the method decreases failure and the cost for additional analysis.
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Citations
13 Claims
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1. An in-situ analysis method of an atomic layer deposition (ALD) process, the method comprising:
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transferring a substrate to a reaction chamber in a vacuum container and depositing an atomic layer on the upper surface of the substrate; and
analyzing the state of the atomic layer to determine the quality of the atomic layer in real time. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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Specification