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Apparatus and method for testing memory cards

  • US 20040267481A1
  • Filed: 05/19/2004
  • Published: 12/30/2004
  • Est. Priority Date: 05/20/2003
  • Status: Active Grant
First Claim
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1. A first circuit for use with a first memory card, the card having a plurality of memory chips, the first circuit comprising:

  • a memory-chip interface;

    a high-speed external interface connected to receive write data for sending to the memory-chip interface, and to transmit data obtained from the memory-chip interface; and

    a test engine configured to control the high-speed interface and/or the memory chips and to provide testing functions for this first card and of a second substantially identical circuit on a second memory card.

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