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Probes and methods for detecting defects in metallic structures

  • US 20050007108A1
  • Filed: 07/11/2003
  • Published: 01/13/2005
  • Est. Priority Date: 07/11/2003
  • Status: Abandoned Application
First Claim
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1. An eddy current probe for detecting defects in an electrically conductive specimen under test (SUT), the eddy current probe comprising:

  • a. at least one excitation coil having a cross-section disposed within a common plane, the at least one excitation coil having a symmetry axis within the common plane, wherein the at least one excitation coil creates a magnetic field and eddy currents into SUT; and

    b. at least one magnetic senor operable to be positioned on the symmetry axis of the at least one excitation coil and having a sensitive axis operable to be disposed within the common plane perpendicular to the symmetry axis of the at least one excitation coil.

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