Cascode circuit and integrated circuit having it
First Claim
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1. A cascode circuit comprising:
- a first field effect transistor which has a source terminal grounded;
a second field effect transistor which has a source terminal connected to a drain terminal of said first field effect transistor; and
a first capacitor connected between the source terminal of said first field effect transistor and a gate terminal of said second field effect transistor, wherein said first field effect transistor and said second field effect transistor are cascode-connected successively; and
a capacitance value of said first capacitor is 0.01 to 10 times that between the gate and source terminals of said second field effect transistor.
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Abstract
A cascode circuit includes a first field effect transistor which has a source terminal grounded, a second field effect transistor which has a source terminal connected to a drain terminal of the first field effect transistor, and a first capacitor connected between the source terminal of the first field effect transistor and a gate terminal of the second field effect transistor. The first field effect transistor and the second field effect transistor are cascode-connected successively. A capacitance value of the first capacitor is 0.01 to 10 times that between the gate and source terminals of the second field effect transistor.
51 Citations
36 Claims
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1. A cascode circuit comprising:
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a first field effect transistor which has a source terminal grounded;
a second field effect transistor which has a source terminal connected to a drain terminal of said first field effect transistor; and
a first capacitor connected between the source terminal of said first field effect transistor and a gate terminal of said second field effect transistor, wherein said first field effect transistor and said second field effect transistor are cascode-connected successively; and
a capacitance value of said first capacitor is 0.01 to 10 times that between the gate and source terminals of said second field effect transistor. - View Dependent Claims (2, 3, 9, 11)
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4. A cascode circuit comprising:
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n field effect transistors, where n is a positive integer equal to or larger than three, wherein said n field effect transistors include;
a first field effect transistor having a source terminal grounded; and
n−
1 field effect transistors, wherein an m-th field effect transistor having a source terminal connected to a drain terminal of an (m−
1)-th field effect transistor, where m is a positive integer between 2 and n;
said n field effect transistors being cascode-connected successively; and
n−
1 capacitors, wherein an (m−
1)-th capacitor connected between the source terminal of said first field effect transistor and a gate terminal of said m-th field effect transistor; and
a capacitance value of said first capacitor is 0.01 to 10 times that between the gate and source terminals of said second field effect transistor. - View Dependent Claims (5, 6, 7, 8, 10, 12)
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13. An integrated circuit comprising at least one cascode circuit, wherein each of said at least one cascode circuit includes:
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a first field effect transistor which has a source terminal grounded;
a second field effect transistor which has a source terminal connected to a drain terminal of said first field effect transistor; and
a first capacitor connected between the source terminal of said first field effect transistor and a gate terminal of said second field effect transistor;
said first field effect transistor and said second field effect transistor are cascode-connected successively; and
a capacitance value of said first capacitor is 0.01 to 10 times that between the gate and source terminals of said second field effect transistor;
wherein said integrated circuit includes;
at least one source electrode region capable of being connected to the outside of said integrated circuit;
at least one drain electrode region capable of being connected to the outside of said integrated circuit;
a field effect transistor region which includes a source electrode of said first field effect transistor of each of said at least one cascode circuit, a gate electrode of said first field effect transistor thereof, a gate electrode of said second field effect transistor thereof, and a drain electrode of said second field effect transistor thereof; and
a single capacitor region which corresponds to said first capacitor of each of said at least one cascode circuit;
wherein said at least one source electrode region, said at least one drain electrode region, said field effect transistor region, and said single capacitor region are provided on a semiconductor substrate;
each of at least one source electrode of said field effect transistor region and each of at least one drain electrode thereof are electrically connected to said at least one source electrode region and said at least one drain electrode region, respectively; and
said single capacitor region is disposed in the vicinity of said field effect transistor region. - View Dependent Claims (14, 17, 19, 21, 23, 25, 28, 31, 34)
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15. An integrated circuit comprising at least one cascode circuit, wherein each of said at least one cascode circuit includes:
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n field effect transistors, where n is a positive integer equal to or larger than three, wherein said n field effect transistors include;
a first field effect transistor having a source terminal grounded; and
n−
1 field effect transistors, wherein an m-th field effect transistor having a source terminal connected to a drain terminal of an (m−
1)-th field effect transistor, where m is a positive integer between 2 and n;
said n field effect transistors being cascode-connected successively; and
n−
1 capacitors, wherein an (m−
1)-th capacitor connected between the source terminal of said first field effect transistor and a gate terminal of said m-th field effect transistor; and
a capacitance value of said first capacitor is 0.01 to 10 times that between the gate and source terminals of said second field effect transistor;
wherein said integrated circuit includes;
at least one source electrode region capable of being connected to the outside of said integrated circuit;
at least one drain electrode region capable of being connected to the outside of said integrated circuit;
a field effect transistor region which includes a source electrode of said first field effect transistor of each of said at least one cascode circuit, a gate electrode of said q-th field effect transistor thereof, and a drain electrode of said n-th field effect transistor thereof, where q is a positive integer between 1 and n; and
n−
1 capacitor regions which correspond to said n−
1 capacitors of each of said at least one cascode circuit;
said at least one source electrode region, said at least one drain electrode region, said field effect transistor region, and said n−
1 capacitor regions are provided on a semiconductor substrate;
each of at least one source electrode and each of at least one drain electrode of said field effect transistor region are electrically connected to said at least one source electrode region and said at least one drain electrode region, respectively; and
said n−
1 capacitor regions are disposed in the vicinity of said field effect transistor region. - View Dependent Claims (16, 18, 20, 22, 24, 26, 29, 33, 36)
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27. The integrated circuit having a plurality of cascode circuits, wherein each of said plurality of cascode circuit comprises:
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a first field effect transistor which has a source terminal grounded;
a second field effect transistor which has a source terminal connected to a drain terminal of said first field effect transistor; and
a first capacitor connected between the source terminal of said first field effect transistor and a gate terminal of said second field effect transistor;
wherein said first field effect transistor and said second field effect transistor are cascode-connected successively; and
a capacitance value of said first capacitor is 0.01 to 10 times that between the gate and source terminals of said second field effect transistor;
said integrated circuit comprises;
a plurality of source electrode regions capable of being connected to the outside of said integrated circuit;
a plurality of drain electrode regions capable of being connected to the outside of said integrated circuit;
a plurality of field effect transistor regions each of which includes source and gate electrodes of said first field effect transistor of at least one of said plurality of cascode circuits, and gate and drain electrodes of said second field effect transistor of at least one of them; and
a plurality of capacitor regions each of which corresponds to said first capacitor of each of said plurality of cascode circuits;
said plurality of source regions, said plurality of drain regions, said plurality of field effect transistor regions, and said plurality of capacitor regions are provided on a semiconductor substrate;
said integrated circuit comprising a plurality of cell assemblies each of which includes one of said plurality of source electrode regions, one of said plurality of drain electrode regions, one of said plurality of field effect transistor regions, and one of said plurality of capacitor regions;
said capacitor region and said source electrode region are opposed to each other in each of said plurality of cell assemblies;
said field effect transistor region is arranged between said capacitor region and said source electrode region in each of said plurality of cell assemblies;
a direction in which said drain electrode region and said field effect transistor region are opposed to each other is perpendicular to that in which said capacitor region and said source electrode region are opposed to each other in each of said plurality of cell assemblies; and
said capacitor region of each of said a plurality of cell assemblies is connected to said source electrode region of an adjacent cell assembly. - View Dependent Claims (30, 32, 35)
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Specification