Methods and apparatus for collection of optical reference measurements for monolithic sensors

• US 20050007582A1
• Filed: 07/07/2004
• Published: 01/13/2005
• Est. Priority Date: 07/07/2003
• Status: Abandoned Application

• Current Assignee: HID Global Corporation (Assa Abloy AB)
• Original Assignee: Lumidigm Incorporated (Assa Abloy AB)
• Inventors: Unruh, Karen E., Rowe, Robert K., Villers, Philippe, Nixon, Kristin A.
• Application Number:
  US10/886,941
• Publication Number:
  US 20050007582A1
• Time in Patent Office: Days
• US Class Current: 356/300
• CPC Class Codes: G01N 21/31 Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry G01N21/72 takes precedence

Abstract

Methods and apparatus are provided for collecting optical data. Light is propagated through a reference sample from a source of light to a detector of light to produce a measured reference spectral distribution. Light is also propagated through a subject sample from the source of light to the detector of light to produce a measured subject spectral distribution. At least one of an intensity change and a wavelength shift between the measured reference spectral distribution and a stored reference spectral distribution is identified. The measured subject spectral distribution is compared with a stored subject spectral distribution associated with the stored reference spectral distribution. Such comparison includes accounting for the identified one of the intensity change and the wavelength shift.

Claims

1. A method for collecting optical data, the method comprising:

propagating light from a source of light to a detector of light to produce a measured reference spectral distribution by interaction of the light with a reference sample;

propagating light from the source of light to the detector of light to produce a measured subject spectral distribution by interaction of the light with a subject sample;

identifying at least one of an intensity change and a wavelength shift between the measured reference spectral distribution and a stored reference spectral distribution; and

comparing the measured subject spectral distribution and its associated stored reference spectral distribution with a stored subject spectral distribution and its associated stored reference spectral distribution, wherein such comparing includes accounting for the identified one of the intensity change and the wavelength shift.

5. The method recited in claim 1 wherein the reference sample comprises a plurality of areas of substantially homogeneous material.

6. The method recited in claim 5 wherein:

the source of light comprises one or more sources of light;

the detector of light comprises a plurality of detectors of light; and

each of the areas of substantially homogeneous material is associated with a path from one of the one or more sources of light to one of the plurality of detectors of light.

12. The method recited in claim 1 further comprising selectively presenting the reference sample to be encountered by an optical path from the source of light to the detector of light.

13. The method recited in claim 12 wherein selectively presenting the reference sample comprises dispensing a discrete unit of the reference sample from a device.

14. The method recited in claim 12 wherein:

the reference sample comprises a solid piece; and

selectively presenting the reference sample comprises moving the reference sample.

15. The method recited in claim 12 wherein:

the reference sample comprises a plurality of holes arranged according to a geometrical arrangement of the source of light and the detector of light; and

selectively presenting the reference sample comprises moving the reference sample to align the plurality of holes with the geometrical arrangement.

16. The method recited in claim 12 wherein:

the reference sample comprises a material having a first state that is opaque at a wavelength of the source of light and a second state that is transparent at the wavelength of the source of light; and

selectively presenting the reference sample comprises changing the state of the material.

17. The method recited in claim 12 further comprising shielding the detector of light from ambient light with the reference sample while propagating light through the subject sample.

2-4. -4. (Canceled).

7-11. -11. (Canceled).

18. An optical sensor comprising:

a source of light;

a detector of light; and

a reference sample disposed to encounter light along optical paths from the source to the detector, wherein the reference sample is composed to permit determination of composite information on intensity changes and wavelength shifts of the source of light from a plurality of distinct optical measurements using the optical sensor.

23. The optical sensor recited in claim 18 wherein:

the source of light comprises one or more sources of light;

the detector of light comprises a plurality of detectors of light; and

each of the areas of substantially homogeneous material is associated with a path from one of the one or more sources of light to one of the plurality of detectors of light.

24. The optical sensor recited in claim 18 wherein the reference sample comprises a plurality of reference samples, at least one of which is substantially spectrally flat.

26. The optical sensor recited in claim 18 wherein the reference sample comprises a spectrally dispersive element.

29. The optical sensor recited in claim 18 further comprising a device adapted for selective presentation of the reference sample to the source of light and detector of light.

30. The optical sensor recited in claim 29 wherein the device is further adapted to act as a protective cover for the optical sensor.

31. The optical sensor recited in claim 29 wherein the device is adapted to dispense discrete units of the reference sample.

32. The optical sensor recited in claim 29 wherein:

the reference sample comprises a plurality of holes arranged according to a geometrical arrangement of the source of light and the detector of light; and

the device is adapted to move the reference sample to align the plurality of holes with the geometrical arrangement.

33. The optical sensor recited in claim 29 wherein:

the reference sample comprises a material having a first state that is opaque at a wavelength of the source of light and a second state that is transparent at the wavelength of the source of light; and

the device is adapted to change the state of the material.

34. The optical sensor recited in claim 29 wherein the device is adapted to shield the detector of light from ambient light with the reference sample while light is propagated through a subject sample.

35. The optical sensor recited in claim 18 further comprising a substrate over which the source of light and the detector of light are disposed, wherein the substrate permits light-leakage paths from the source of light to the detector of light.

19-22. -22. (Canceled).

25. (Canceled).

27-28. -28. (Canceled)