X-ray examination apparatus and method

• US 20050018812A1
• Filed: 12/02/2002
• Published: 01/27/2005
• Est. Priority Date: 12/11/2001
• Status: Active Grant

• Current Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Original Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Inventors: Wolfs, Peter Bas Anton
• Granted Patent: US 7,035,376 B2
• Time in Patent Office: Days
• US Class Current: 378/97
• CPC Class Codes: G01T 1/02 Dosimeters G01T1/15 takes precedence
• CPC Class Codes: H05G 1/44 in which the switching instant is determined by measuring the amount of radiation directly dosimetry in general G01T1/02

Abstract

The invention relates to an X-ray examination apparatus and a corresponding method. To provide a fast and accurate control of the X-ray dose combining a fast and inaccurate sensor dose signal from an X-ray sensor and a slow and accurate detector dose signal (I) from an X-ray detector taking into account the delay between said two signals, an X-ray examination apparatus is proposed comprising:

• • an X-ray source (1) for generating X-rays,
  • an X-ray detecting means (2, 6) for detecting X-rays after penetration through an object of interest (3) providing a detector dose signal (I) accurately indicating the X-ray dose,
  • an X-ray dose sensing means (5) for measuring the current X-ray dose of the X-rays penetrating the object of interest (3) providing a sensor dose signal (S) indicating the current X-ray dose,
  • control means (7-13) for controlling said X-ray source (1) by a control signal (C) being adapted for generating said control signal (C) by correcting said sensor dose signal (S), said control means comprising: a storage means for storing a number of values of the last measured sensor dose signal, and a correcting means for generating a correction signal for correcting the sensor dose signal, said correction signal being generated from the current value of said detector dose signal and the stored value of the sensor dose signal measured at essentially the same time as said value of said detector dose signal.

Claims

1. An X-ray examination apparatus, comprising:

an X-ray source for generating X-rays;

X-ray detecting means for detecting X-rays after penetration through an object of interest providing a detector dose signal accurately indicating the X-ray dose;

X-ray dose sensing means for measuring the current X-ray dose of the X-rays penetrating the object of interest providing a sensor dose signal indicating the current X-ray dose; and

control means for controlling said X-ray source by a control signal being adapted for generating said control signal by correcting said sensor dose signal, said control means comprising storage means for storing a number of values of the last measured sensor dose signal and correcting means for generating a correction signal for correcting the sensor dose signal, said correction signal being generated from the current value of said detector dose signal and the stored value of the sensor dose signal measured at essentially the same time as said value of said detector dose signal.

2. An X-ray examination apparatus as claimed in claim 1, wherein said correcting means comprises a divider for dividing said value of said detector dose signal by said value of sensor dose signal to generate said correction signal, and wherein said control means further comprises a multiplier for multiplying said correction signal with the current value of said sensor dose signal.

3. An X-ray examination apparatus as claimed in claim 1, wherein said correcting means further comprises a low-pass filter for controlling the dynamic behavior of said control.

4. An X-ray examination apparatus as claimed in claim 1, wherein said X-ray detecting means further comprises an adaption signal generating means for generating an adaption signal for correcting said control signal by correcting the average grey level value of said detector dose signal, and wherein said control means further comprises an adaption means for correcting said control signal with said adaption signal.

5. An X-ray examination apparatus as claimed in claim 1, wherein said X-ray detecting means comprises an analog X-ray detector and an image intensifier or a flat digital X-ray detector and image processing means for generating said detector dose signal.

6. An X-ray examination apparatus as claimed in claim 1,

wherein said control signal is adapted for controlling X-ray exposure conditions, the exposure condition being at least one condition selected from the group consisting of X-ray intensity, diaphragm size, and exposure time.

7. An X-ray examination apparatus as claimed in claim 1, wherein said control means are adapted for generating said control signal by correcting said sensor dose signal with said detector dose signal both resulting from the same region of interest.

8. An X-ray examination method,

wherein X-rays generated by an X-ray source are detected by an X-ray detecting means after penetrating through an object of interest, said X-ray detecting means providing a detector dose signal accurately indicating the X-ray dose,

wherein the current X-ray dose of the X-rays penetrating the object of interest are measured by an X-ray dose sensing means providing a sensor dose signal indicating the current X-ray dose, and

wherein a control signal for controlling said X-ray source is generated by control means by correcting said sensor dose signal, wherein a number of values of the last measured sensor dose signal are stored in storage means, and a correction signal for correcting the sensor dose signal is generated by correcting means from the current value of said detector dose signal and the stored value of the sensor dose signal measured at essentially the same time as said value of said detector dose signal.

9. A computer program product comprising program code means for causing a computer to generate said control signal according to said method as claimed in claim 8 when said computer program is run on a computer.