Method and system for test data capture and compression for electronic device analysis
First Claim
1. An electronic device testing system comprising:
- a tester operable to generate test data and apply the test data to the electronic device to determine the response of the electronic device;
a capture interface operable to capture the test data communicated to the electronic device by the tester;
a compression engine in communication with the capture interface and operable to compress the test data; and
memory in communication with the compression engine and operable to save the compressed test data.
1 Assignment
0 Petitions
Accused Products
Abstract
Electronic devices, such as memory devices are tested by applying test data, such as vectors of memory data having data field, control and address information, with a tester to detect error responses. Applied test data is captured, compressed and stored for subsequent analysis to isolate the test data associated with the error response. The saved compressed test data is de-compressed to replay the test data for a logic analyzer so that adequate history of the test data exists to determine the test cycles that included the stimulus associated with the error response. Identification of the test cycles that include the stimulus associated with the error response allows creation of test programs that run in reduced time by avoiding empty test cycles not associated with the error response.
-
Citations
17 Claims
-
1. An electronic device testing system comprising:
-
a tester operable to generate test data and apply the test data to the electronic device to determine the response of the electronic device;
a capture interface operable to capture the test data communicated to the electronic device by the tester;
a compression engine in communication with the capture interface and operable to compress the test data; and
memory in communication with the compression engine and operable to save the compressed test data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. A method for testing electronic devices, the method comprising:
-
generating test data for application to the electronic device;
communicating the test data to the electronic device through an interface;
capturing the test data communicated to the electronic device;
compressing the captured test data;
storing the compressed test data;
detecting an error response by the electronic device to the test data; and
analyzing the compressed test data to identify the source of the error response. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17)
-
Specification