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Method and system for test data capture and compression for electronic device analysis

  • US 20050021275A1
  • Filed: 06/20/2003
  • Published: 01/27/2005
  • Est. Priority Date: 06/21/2002
  • Status: Active Grant
First Claim
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1. An electronic device testing system comprising:

  • a tester operable to generate test data and apply the test data to the electronic device to determine the response of the electronic device;

    a capture interface operable to capture the test data communicated to the electronic device by the tester;

    a compression engine in communication with the capture interface and operable to compress the test data; and

    memory in communication with the compression engine and operable to save the compressed test data.

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